Number of records found: 61
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Citations
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Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
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Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11)”. Klingstedt M, Sundberg M, Eriksson L, Haigh S, Kirkland A, Grüner D, de Backer A, Van Aert S, Tarasaki O, Zeitschrift für Kristallographie 227, 341 (2012). http://doi.org/10.1524/zkri.2012.1517
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Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images”. Gonnissen J, de Backer A, den Dekker AJ, Martinez GT, Rosenauer A, Sijbers J, Van Aert S, Applied physics letters 105, 063116 (2014). http://doi.org/10.1063/1.4892884
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Procedure to count atoms with trustworthy single-atom sensitivity”. Van Aert S, de Backer A, Martinez GT, Goris B, Bals S, Van Tendeloo G, Rosenauer A, Physical review : B : condensed matter and materials physics 87, 064107 (2013). http://doi.org/10.1103/PhysRevB.87.064107
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In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals”. Geuchies JJ, van Overbeek C, Evers WH, Goris B, de Backer A, Gantapara AP, Rabouw FT, Hilhorst J, Peters JL, Konovalov O, Petukhov AV, Dijkstra M, Siebbeles LDA, van Aert S, Bals S, Vanmaekelbergh D, Nature materials 15, 1248 (2016). http://doi.org/10.1038/nmat4746
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Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM”. Varambhia AM, Jones L, De Backer A, Fauske VT, Van Aert S, Ozkaya D, Nellist PD, Particle and particle systems characterization 33, 438 (2016). http://doi.org/10.1002/ppsc.201600067
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Atomic resolution electron tomography”. Bals S, Goris B, de Backer A, Van Aert S, Van Tendeloo G, MRS bulletin 41, 525 (2016). http://doi.org/10.1557/mrs.2016.138
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities”. De Backer A, Jones L, Lobato I, Altantzis T, Goris B, Nellist PD, Bals S, Van Aert S, Nanoscale 9, 8791 (2017). http://doi.org/10.1039/C7NR02656K
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Three-dimensional atomic structure of supported Au nanoparticles at high temperature”. Liu P, Arslan Irmak E, De Backer A, De wael A, Lobato I, Béché, A, Van Aert S, Bals S, Nanoscale 13 (2021). http://doi.org/10.1039/D0NR08664A
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Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy”. van den Bos KH W, De Backer A, Martinez GT, Winckelmans N, Bals S, Nellist PD, Van Aert S, Physical review letters 116, 246101 (2016). http://doi.org/10.1103/PhysRevLett.116.246101
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Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy”. Van Aert S, De Backer A, Jones L, Martinez GT, Béché, A, Nellist PD, Physical review letters 122, 066101 (2019). http://doi.org/10.1103/PhysRevLett.122.066101
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Interface Pattern Engineering in Core‐Shell Upconverting Nanocrystals: Shedding Light on Critical Parameters and Consequences for the Photoluminescence Properties”. Hudry D, De Backer A, Popescu R, Busko D, Howard IA, Bals S, Zhang Y, Pedrazo‐Tardajos A, Van Aert S, Gerthsen D, Altantzis T, Richards BS, Small , 2104441 (2021). http://doi.org/10.1002/smll.202104441
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Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy”. De wael A, De Backer A, Jones L, Varambhia A, Nellist PD, Van Aert S, Physical Review Letters 124, 106105 (2020). http://doi.org/10.1103/PhysRevLett.124.106105
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Locating and controlling the Zn content in In(Zn)P quantum dots”. Kirkwood N, De Backer A, Altantzis T, Winckelmans N, Longo A, Antolinez FV, Rabouw FT, De Trizio L, Geuchies JJ, Mulder JT, Renaud N, Bals S, Manna L, Houtepen AJ, Chemistry of materials 32, 557 (2019). http://doi.org/10.1021/acs.chemmater.9b04407
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Quantifying Strain and Dislocation Density at Nanocube Interfaces after Assembly and Epitaxy”. Agrawal H, Patra BK, Altantzis T, De Backer A, Garnett EC, Acs Applied Materials &, Interfaces 12, 8788 (2020). http://doi.org/10.1021/acsami.9b17779
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de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?”.De Backer A, De Wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644Electron Microscopy and Analysis Group Conference (EMAG), JUN 02-JUL 02, 2015, Manchester, ENGLAND, 012034 (2015). http://doi.org/10.1088/1742-6596/644/1/012034
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits?”.de Backer A, De wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644, 012034 (2015). http://doi.org/10.1088/1742-6596/644/012034
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StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Journal of physics : conference series T2 –, Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902, 012013 (2017). http://doi.org/10.1088/1742-6596/902/1/012013
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Recent breakthroughs in scanning transmission electron microscopy of small species”. van den Bos KHW, Altantzis T, De Backer A, Van Aert S, Bals S, Advances in Physics: X 3, 1480420 (2018). http://doi.org/10.1080/23746149.2018.1480420
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Investigating lattice strain in Au nanodecahedrons”. Goris B, De Beenhouwer J, de Backer A, Zanaga D, Batenburg J, Sanchez-Iglesias A, Liz-Marzan L, Van Aert S, Sijbers J, Van Tendeloo G, Bals S, , 11 (2016). http://doi.org/10.1002/9783527808465.EMC2016.5519
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Atom column detection”. Fatermans J, de Backer A, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 177 (2021).
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Atom counting”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 91 (2021).
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Efficient fitting algorithm”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 73 (2021).
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General conclusions and future perspectives”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 243 (2021).
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Image-quality evaluation and model selection with maximum a posteriori probability”. Fatermans J, de Backer A, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 215 (2021).
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Introduction”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 1 (2021).
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Optimal experiment design for nanoparticle atom counting from ADF STEM images”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 145 (2021).
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Statistical parameter estimation theory : principles and simulation studies”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 29 (2021).
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