Number of records found: 3074
 | 
Citations
 | 
   web
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”. de Backer A, Martinez GT, MacArthur KE, Jones L, Béché, A, Nellist PD, Van Aert S, Ultramicroscopy 151, 56 (2015). http://doi.org/10.1016/j.ultramic.2014.11.028
toggle visibility
Electron tomography based on highly limited data using a neural network reconstruction technique”. Bladt E, Pelt DM, Bals S, Batenburg KJ, Ultramicroscopy 158, 81 (2015). http://doi.org/10.1016/j.ultramic.2015.07.001
toggle visibility
Homogeneity and composition of AlInGaN : a multiprobe nanostructure study”. Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A, Ultramicroscopy 156, 29 (2015). http://doi.org/10.1016/j.ultramic.2015.04.012
toggle visibility
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images”. de Backer A, De wael A, Gonnissen J, Van Aert S, Ultramicroscopy 151, 46 (2015). http://doi.org/10.1016/j.ultramic.2014.10.015
toggle visibility
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials”. Van Eyndhoven G, Kurttepeli M, van Oers CJ, Cool P, Bals S, Batenburg KJ, Sijbers J, Ultramicroscopy 148, 10 (2015). http://doi.org/10.1016/j.ultramic.2014.08.008
toggle visibility
Prospects for versatile phase manipulation in the TEM : beyond aberration correction”. Guzzinati G, Clark L, Béché, A, Juchtmans R, Van Boxem R, Mazilu M, Verbeeck J, Ultramicroscopy 151, 85 (2015). http://doi.org/10.1016/j.ultramic.2014.10.007
toggle visibility
Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
toggle visibility
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography”. van Aarle W, Palenstijn WJ, De Beenhouwer J, Altantzis T, Bals S, Batenburg KJ, Sijbers J, Ultramicroscopy 157, 35 (2015). http://doi.org/10.1016/j.ultramic.2015.05.002
toggle visibility
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA”. Lobato I, Van Dyck D, Ultramicroscopy 156, 9 (2015). http://doi.org/10.1016/j.ultramic.2015.04.016
toggle visibility
Deposition of aminosilane coatings on porous Al2O3microspheres by means of dielectric barrier discharges”. Garzia Trulli M, Claes N, Pype J, Bals S, Baert K, Terryn H, Sardella E, Favia P, Vanhulsel A, Plasma processes and polymers 14, 1600211 (2017). http://doi.org/10.1002/ppap.201600211
toggle visibility
Influence of Al content on the properties of MgO grown by reactive magnetron sputtering”. Saraiva M, Chen H, Leroy WP, Mahieu S, Jehanathan N, Lebedev O, Georgieva V, Persoons R, Depla D, Plasma processes and polymers 6, S751 (2009). http://doi.org/10.1002/ppap.200931809
toggle visibility
Unique nanostructural features in Fe, Mn-doped YBCO thin films”. Meledin A, Turner S, Cayado P, Mundet B, Solano E, Ricart S, Ros J, Puig T, Obradors X, Van Tendeloo G, Superconductor science and technology 29, 125009 (2016). http://doi.org/10.1088/0953-2048/29/12/125009
toggle visibility
Tilted BaHfO3 nanorod artificial pinning centres in REBCO films on inclined substrate deposited-MgO coated conductor templates”. Stafford BH, Sieger M, Ottolinger R, Meledin A, Strickland NM, Wimbush SC, Van Tendeloo G, Huehne R, Schultz L, Superconductor science and technology 30, 055002 (2017). http://doi.org/10.1088/1361-6668/AA621D
toggle visibility
Influence of artificial pinning centers on structural and superconducting properties of thick YBCO films on ABAD-YSZ templates”. Pahlke P, Sieger M, Ottolinger R, Lao M, Eisterer M, Meledin A, Van Tendeloo G, Haenisch J, Holzapfel B, Schultz L, Nielsch K, Huehne R, Superconductor science and technology 31, 044007 (2018). http://doi.org/10.1088/1361-6668/AAAFBE
toggle visibility
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov S, Superconductor science and technology 10, 356 (1997)
toggle visibility
Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties”. Verbist K, Lebedev OI, Verhoeven MAJ, Winchern R, Rijnders AJHM, Blank DHA, Tafuri F, Bender H, Van Tendeloo G, Superconductor science and technology 11, 13 (1998). http://doi.org/10.1088/0953-2048/11/1/004
toggle visibility
YBa2Cu3O7-x Josephson junctions and dc SQUIDs based on 45\text{\textdegree} a-axis tilt and twist grain boundaries : atomically clean interfaces for applications”. Tafuri F, Carillo F, Lombardi F, Granozio FM, dii Uccio US, Testa G, Sarnelli E, Verbist K, Van Tendeloo G, Superconductor science and technology T2 –, International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA 12, 1007 (1999). http://doi.org/10.1088/0953-2048/12/11/393
toggle visibility
Chemical solution deposition: a path towards low cost coated conductors”. Obradors X, Puig T, Pomar A, Sandiumenge F, Piñol S, Mestres N, Castaño O, Coll M, Cavallaro A, Palau A, Gázquez J, González JC, Gutiérrez J, Romá, N, Ricart S, Moretó, JM, Rossell MD, Van Tendeloo G, Superconductor science and technology 17, 1055 (2004). http://doi.org/10.1088/0953-2048/17/8/020
toggle visibility
The superstructure and superconductivity of Ru1222 based RuSr2Gd2-x-yYyCexCu2O10-\delta compounds”. Tan H, Lebedev OI, McLaughlin AC, Van Tendeloo G, Superconductor science and technology 23, 115013 (2010). http://doi.org/10.1088/0953-2048/23/11/115013
toggle visibility
Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors”. Molina L, Tan H, Biermans E, Batenburg KJ, Verbeeck J, Bals S, Van Tendeloo G, Superconductor science and technology 24, 065019 (2011). http://doi.org/10.1088/0953-2048/24/6/065019
toggle visibility
Interlayer structure in YBCO-coated conductors prepared by chemical solution deposition”. Molina L, Egoavil R, Turner S, Thersleff T, Verbeeck J, Holzapfel B, Eibl O, Van Tendeloo G, Superconductor science and technology 26, 075016 (2013). http://doi.org/10.1088/0953-2048/26/7/075016
toggle visibility
The superconducting proximity effect in epitaxial Al/Pb nanocomposites”. Wang H, Picot T, Houben K, Moorkens T, Grigg J, Van Haesendonck C, Biermans E, Bals S, Brown SA, Vantomme A, Temst K, Van Bael MJ;, Superconductor science and technology 27, 015008 (2014). http://doi.org/10.1088/0953-2048/27/1/015008
toggle visibility
Epitaxial YBa2Cu3O7−xnanocomposite thin films from colloidal solutions”. Cayado P, De Keukeleere K, Garzón A, Perez-Mirabet L, Meledin A, De Roo J, Vallés F, Mundet B, Rijckaert H, Pollefeyt G, Coll M, Ricart S, Palau A, Gázquez J, Ros J, Van Tendeloo G, Van Driessche I, Puig T, Obradors X, Superconductor science and technology 28, 124007 (2015). http://doi.org/10.1088/0953-2048/28/12/124007
toggle visibility
Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films”. Molina-Luna L, Duerrschnabel M, Turner S, Erbe M, Martinez GT, Van Aert S, Holzapfel B, Van Tendeloo G, Superconductor science and technology 28, 115009 (2015). http://doi.org/10.1088/0953-2048/28/11/115009
toggle visibility
BaHfO3artificial pinning centres in TFA-MOD-derived YBCO and GdBCO thin films”. Erbe M, Hänisch J, Hühne R, Freudenberg T, Kirchner A, Molina-Luna L, Damm C, Van Tendeloo G, Kaskel S, Schultz L, Holzapfel B, Superconductor science and technology 28, 114002 (2015). http://doi.org/10.1088/0953-2048/28/11/114002
toggle visibility
Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage”. Nord M, Webster RWH, Paton KA, McVitie S, McGrouther D, MacLaren I, Paterson GW, Microscopy And Microanalysis 26, Pii S1431927620001713 (2020). http://doi.org/10.1017/S1431927620001713
toggle visibility
Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization”. Paterson GW, Webster RWH, Ross A, Paton KA, Macgregor TA, McGrouther D, MacLaren I, Nord M, Microscopy And Microanalysis 26, 944 (2020). http://doi.org/10.1017/S1431927620024307
toggle visibility
On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors”. Wang J, Nguyen MD, Gauquelin N, Verbeeck J, Do MT, Koster G, Rijnders G, Houwman E, Physica Status Solidi-Rapid Research Letters 14, 1900520 (2020). http://doi.org/10.1002/PSSR.201900520
toggle visibility
Phase object reconstruction for 4D-STEM using deep learning”. Friedrich T, Yu C-P, Verbeeck J, Van Aert S, Microscopy and microanalysis 29, 395 (2023). http://doi.org/10.1093/MICMIC/OZAC002
toggle visibility
Local orbital angular momentum revealed by spiral-phase-plate imaging in transmission-electron microscopy”. Juchtmans R, Verbeeck J, Physical Review A 93, 023811 (2016). http://doi.org/10.1103/PhysRevA.93.023811
toggle visibility