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Author
Title
Year
Publication
Volume
Times cited
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Gijbels, R.
Oppervlakte en in-diepte analyse via SIMS, SNMS en GDMS
1992
Physicalia magazine
14
UA library record
Gijbels, R.
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces
2003
UA library record
Gijbels, R.
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals
1991
Acta technica Belgica: metallurgie
30
UA library record
Gijbels, R.
Development of a Fourier transform laser microprobe mass spectrometer with external ion source
1993
ICR/Ion trap newsletter
30
UA library record