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Author | de Nolf, W.; Jaroszewicz, J.; van der Snickt, G.; Janssens, K.; Farnell, S.; Klaassen, L. | ||||
Title | Combined micro-XRF/XRPD tomography on historical and modern paint multilayer samples at Beamline L | Type | H3 Book chapter | ||
Year | 2008 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 1633-1634 | ||
Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ admin @ c:irua:74475 | Serial | 5522 | ||
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