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Author | Potapov, P.L.; Schryvers, D. | ||||
Title | Measuring the absolute position of EELS ionisation edges in a TEM | Type | A1 Journal article | ||
Year | 2004 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 99 | Issue | Pages | 73-85 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000220804700005 | Publication Date | 2003-08-12 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 29 | Open Access | |
Notes | Approved ![]() |
Most recent IF: 2.843; 2004 IF: 2.215 | |||
Call Number | UA @ lucian @ c:irua:48781 | Serial | 1970 | ||
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