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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 3, 1 (1994)
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Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Verbeeck A, de Keyzer R, Journal of crystal growth 110, 930 (1991)
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Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis”. Oleshko V, Gijbels R, Jacob W, Lakiere F, van Daele A, Silaev E, Kaplun L, Microscopy, microanalysis, microstructures 6, 79 (1995). http://doi.org/10.1051/mmm:1995108
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Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas”. Volkov VV, van Landuyt J, Marushkin KM, Gijbels R, Férauge C, Vasilyev MG, Shelyakin AA, Sokolovsky AA, Journal of crystal growth 173, 285 (1997)
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Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels”. Tirumalasetty GK, van Huis MA, Fang CM, Xu Q, Tichelaar FD, Hanlon DN, Sietsma J, Zandbergen HW, Acta materialia 59, 7406 (2011). http://doi.org/10.1016/j.actamat.2011.08.012
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy”. de Gryse O, Clauws P, Vanhellemont J, Lebedev OI, van Landuyt J, Simoen E, Claeys C, Journal of the electrochemical society 151, G598 (2004). http://doi.org/10.1149/1.1776592
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Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry”. van Cleempoel A, Gijbels R, Claeys M, van den Heuvel H, Rapid communications in mass spectrometry 10, 1579 (1996)
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Characterization of single-wall carbon nanotubes produced by CCVD method”. Colomer J-F, Benoit J-M, Stephan C, Lefrant S, Van Tendeloo G, Nagy JB, Chemical physics letters 345, 11 (2001). http://doi.org/10.1016/S0009-2614(01)00841-7
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Characterization of AgxAuy nano particles by TEM and STEM”. de Vyt A, Gijbels R, Davock H, van Roost C, Geuens I, Journal of analytical atomic spectrometry 14, 499 (1999). http://doi.org/10.1039/a807695b
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Charge ordering-disordering in Th-doped CaMnO3”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Raveau B, European physical journal : B : condensed matter and complex systems 10, 397 (1999). http://doi.org/10.1007/s100510050869
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Charge transfer and polymer phases in AC60 (A=K, Rb, Cs) fullerides”. Nikolaev AV, Prassides K, Michel KH, The journal of chemical physics 108, 4912 (1998). http://doi.org/10.1063/1.475900
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Charged donors in quantum dots: finite difference and fractional dimensions results”. Riva C, Escorcia RA, Govorov AO, Peeters FM, Physical review : B : condensed matter and materials physics 69, 245306 (2004). http://doi.org/10.1103/PhysRevB.69.245306
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM”. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter T2 –, 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308, 294 (2001). http://doi.org/10.1016/S0921-4526(01)00801-8
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Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry”. Struyf H, van Vaeck L, Kennis P, Gijbels R, van Grieken R, Rapid communications in mass spectrometry 10, 699 (1996). http://doi.org/10.1002/(SICI)1097-0231(199604)10:6<699::AID-RCM521>3.0.CO;2-8
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Chemical insight into electroforming of resistive switching manganite heterostructures”. Borgatti F, Park C, Herpers A, Offi F, Egoavil R, Yamashita Y, Yang A, Kobata M, Kobayashi K, Verbeeck J, Panaccione G, Dittmann R;, Nanoscale 5, 3954 (2013). http://doi.org/10.1039/c3nr00106g
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Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS”. Verlinden G, Gijbels R, Geuens I, Microscopy and microanalysis 8, 216 (2002). http://doi.org/10.1017/S1431927602020159
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Chemical solution deposition: a path towards low cost coated conductors”. Obradors X, Puig T, Pomar A, Sandiumenge F, Piñol S, Mestres N, Castaño O, Coll M, Cavallaro A, Palau A, Gázquez J, González JC, Gutiérrez J, Romá, N, Ricart S, Moretó, JM, Rossell MD, Van Tendeloo G, Superconductor science and technology 17, 1055 (2004). http://doi.org/10.1088/0953-2048/17/8/020
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Chemical, structural and electrical characterizations in the BIZNVOX family”. Vernochet C, Vannier R-N, Huvé, M, Pirovano C, Nowogrocki G, Mairesse G, Van Tendeloo G, Journal of materials chemistry 10, 2811 (2000). http://doi.org/10.1039/b006157n
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Chemical structure of nitrogen-doped graphene with single platinum atoms and atomic clusters as a platform for the PEMFC electrode”. Stambula S, Gauquelin N, Bugnet M, Gorantla S, Turner S, Sun S, Liu J, Zhang G, Sun X, Botton GA, The journal of physical chemistry: C : nanomaterials and interfaces 118, 3890 (2014). http://doi.org/10.1021/jp408979h
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The chemical vapor infiltration of exfoliated graphite to produce carbon/carbon composites”. Tikhomirov AS, Sorokina NE, Shornikova ON, Morozov VA, Van Tendeloo G, Avdeev VV, Carbon 49, 147 (2011). http://doi.org/10.1016/j.carbon.2010.08.054
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Chemistry and structure of anion-deficient perovskites with translational interfaces”. Abakumov AM, Hadermann J, Van Tendeloo G, Antipov EV, Journal of the American Ceramic Society 91, 1807 (2008). http://doi.org/10.1111/j.1551-2916.2008.02351.x
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Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes”. Li Y, Yang X-Y, Tian G, Vantomme A, Yu J, Van Tendeloo G, Su B-L, Chemistry of materials 22, 3251 (2010). http://doi.org/10.1021/cm100491r
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Chiral properties of topological-state loops”. Grujić, MM, Tadic MZ, Peeters FM, Physical review : B : condensed matter and materials physics 91, 245432 (2015). http://doi.org/10.1103/PhysRevB.91.245432
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Chiral states in bilayer graphene : magnetic field dependence and gap opening”. Zarenia M, Pereira JM, Farias GA, Peeters FM, Physical review : B : condensed matter and materials physics 84, 125451 (2011). http://doi.org/10.1103/PhysRevB.84.125451
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The chirality of carbon nanotubules determined by dark-field electron microscopy”. Bernaerts D, op de Beeck M, Amelinckx S, van Landuyt J, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74, 723 (1996). http://doi.org/10.1080/01418619608243538
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Ciliary white light : optical aspect of ultrashort laser ablation on transparent dielectrics”. Liu Y, Brelet Y, He Z, Yu L, Mitryukovskiy S, Houard A, Forestier B, Couairon A, Mysyrowicz A, Physical review letters 110, 097601 (2013). http://doi.org/10.1103/PhysRevLett.110.097601
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Circular dichroism in the electron microscope: progress and applications (invited)”. Schattschneider P, Ennen I, Stoger-Pollach M, Verbeeck J, Journal of applied physics 107, 09d311 (2010). http://doi.org/10.1063/1.3365517
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Classical artificial two-dimensional atoms: the Thomson model”. Partoens B, Peeters FM, Journal of physics : condensed matter 9, 5383 (1997)
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