Home
<<
1
>>
List View
|
Citations
|
Details
Author
Title
Year
Publication
Volume
Times cited
Additional Links
Janssens, K.
;
van Langevelde, F.
;
Adams, F.
;
Vis, R.
;
Sutton, S.
;
Rivers, M.
;
Jones, K.
;
Bowen, D.
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
1992
UA library record