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Author | Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. | ||||
Title | Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography | Type | A1 Journal article | ||
Year | 2006 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 106 | Issue | 2 | Pages | 105-113 |
Keywords | A1 Journal article; Electron Microscopy for Materials Science (EMAT); | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000234535900005 | Publication Date | 2005-07-29 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 50 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2006 IF: 1.706 | |||
Call Number | UA @ lucian @ c:irua:56143 | Serial | 678 | ||
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