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Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization”. Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 11, 841 (1996). http://doi.org/10.1039/ja9961100841
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Role of laser-induced melting and vaporization of metals during ICP-MS and LIBS analysis, investigated with computer simulations and experiments”. Bleiner D, Chen Z, Autrique D, Bogaerts A, Journal of analytical atomic spectrometry 21, 910 (2006). http://doi.org/10.1039/b602800d
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Similarities and differences between direct current and radio-frequency glow discharges: a mathematical simulation”. Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 15, 1191 (2000). http://doi.org/10.1039/b000519n
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, Journal of analytical atomic spectrometry 14, 429 (1999). http://doi.org/10.1039/a807276k
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Temporal and spatially resolved laser-scattering plasma diagnostics for the characterization of a ms-pulsed glow discharge”. Gamez G, Bogaerts A, Hieftje GM, Journal of analytical atomic spectrometry 21, 350 (2006). http://doi.org/10.1039/b511764j
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Micro and surface analysis in archaeology”. Adams F, Adriaens A, Aerts A, de Raedt I, Janssens K, Schalm O, Journal of analytical atomic spectrometry 12, 257 (1997). http://doi.org/10.1039/A606091I
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Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF”. Kempenaers L, Janssens K, Jochum KP, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Adams F, Journal of analytical atomic spectrometry 18, 350 (2003). http://doi.org/10.1039/B212196D
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Microscopical X-ray fluorescence analysis and related methods with laboratory and synchrotron radiation sources”. Adams F, Janssens K, Snigirev A, Journal of analytical atomic spectrometry 13, 319 (1998). http://doi.org/10.1039/A707100K
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Suitability of polycapillary optics for focusing of monochromatic synchrotron radiation as used in trace level micro-XANES measurements”. Vincze L, Wei F, Proost K, Vekemans B, Janssens K, He Y, Yan Y, Falkenberg G, Journal of analytical atomic spectrometry 17, 177 (2002). http://doi.org/10.1039/B110210A
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Synchrotron radiation in art and archaeology”. Janssens K, Journal of analytical atomic spectrometry 26, 883 (2011). http://doi.org/10.1039/C1JA90015C
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Trace analysis allows to distinguish between Venetian and facon-de-Venise glass vessels of the 16th and 17th century”. de Raedt I, Janssens K, Veeckman J, Vincze L, Vekemans B, Jeffries T, Journal of analytical atomic spectrometry 16, 1012 (2001). http://doi.org/10.1039/B102597J
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The use of LA-ICP-MS for the characterization of the micro-heterogeneity of heavy metals in BCR CRM 680”. Kempenaers L, Bings NH, Jeffries TE, Vekemans B, Janssens K, Journal of analytical atomic spectrometry 16, 1006 (2001). http://doi.org/10.1039/B102512K
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The use of lead-glass capillaries for microfocusing of highly energetic (0-60 KeV) synchrotron radiation”. Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Knöchel A, Journal of analytical atomic spectrometry 13, 339 (1998). http://doi.org/10.1039/A707700I
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Analysis of speleothems by electron and X-ray microprobes”. Kuczumow A, Vekemans B, Schalm O, Gysels K, Ro C-U, Van Grieken R, Journal of analytical atomic spectrometry 16, 90 (2001). http://doi.org/10.1039/B007725I
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Application of high-energy polarised beam energy dispersive X-ray fluorescence spectrometry to cadmium determination in saline solutions”. van Meel K, Fontàs C, Van Grieken R, Queralt I, Hidalgo M, Marguí, E, Journal of analytical atomic spectrometry 23, 1034 (2008). http://doi.org/10.1039/B718382H
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Comparison between direct current and radiofrequency glow discharge mass spectrometry for the analysis of oxide-based samples”. de Gendt S, Van Grieken R, Hang W, Harrison WW, Journal of analytical atomic spectrometry 10, 689 (1995). http://doi.org/10.1039/JA9951000689
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Critical assessment and proposal for reconstruction of a grazing emission X-ray fluorescence instrument”. Kuczumow A, Schmeling M, Van Grieken R, Journal of analytical atomic spectrometry 15, 535 (2000). http://doi.org/10.1039/A908661G
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Elemental x-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA)”. Tsuji K, Nullens R, Wagatsuma K, Van Grieken RE, Journal of analytical atomic spectrometry 14, 1711 (1999). http://doi.org/10.1039/A905301H
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Optimization of secondary cathode thickness for direct current glow discharge mass spectrometric analysis of glass”. Schelles W, de Gendt S, Van Grieken RE, Journal of analytical atomic spectrometry 11, 937 (1996). http://doi.org/10.1039/JA9961100937
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Processing of three-dimensional microscopic X-ray fluorescence data”. Vekemans B, Vincze L, Brenker FE, Adams F, Journal of analytical atomic spectrometry 19, 1302 (2004). http://doi.org/10.1039/B404300F
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Quantification problems in light element determination by grazing emission X-ray fluorescence”. Kuczumow A, Claes M, Schmeling M, Van Grieken R, de Gendt S, Journal of analytical atomic spectrometry 15, 415 (2000). http://doi.org/10.1039/A908724I
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Quantitative analysis of iron-rich and other oxide-based samples by means of glow discharge mass spectrometry”. de Gendt S, Schelles W, Van Grieken R, Müller V, Journal of analytical atomic spectrometry 10, 681 (1995). http://doi.org/10.1039/JA9951000681
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Quantitative analysis of zirconium oxide by direct glow discharge mass spectrometry using a secondary cathode”. Schelles W, Van Grieken R, Journal of analytical atomic spectrometry 12, 49 (1997)
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Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics”. Szalóki I, Braun M, Van Grieken R, Journal of analytical atomic spectrometry 15, 843 (2000). http://doi.org/10.1039/B000746N
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