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Author
Title
Year
Publication
Volume
Times cited
Additional Links
De wael, A.
;
De Backer, A.
;
Yu, C.-P.
;
Sentürk, D.G.
;
Lobato, I.
;
Faes, C.
;
Van Aert, S.
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM
2022
Microscopy and microanalysis
UA library record
;
WoS full record