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Author Title Year Publication Volume Times cited Additional Links
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) 2006 Applied surface science 252 9 UA library record; WoS full record; WoS citing articles
Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. High crystalline quality erbium silicide films on (100) silicon grown in high vacuum 1996 Applied surface science 102 14 UA library record; WoS full record; WoS citing articles
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. The microstructure and interfaces of intermediate layers in sapphire bicrystals 1997 Applied surface science 119 2 UA library record; WoS full record; WoS citing articles
Adriaensen, L.; Vangaever, F.; Gijbels, R. Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition 2004 Applied surface science 231/232 10 UA library record; WoS full record; WoS citing articles
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings 2006 Applied surface science 252 3 UA library record; WoS full record; WoS citing articles