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Author Title Year Publication Volume Times cited Additional Links
Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. Unveiling the composition of sulphur sensitization specks by their interactions with TAI 2000 Journal Of Imaging Science And Technology 44 16 UA library record; WoS full record; WoS citing articles
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Determination of the silver sulphide cluster size distribution via computer simulations 2000 UA library record; WoS full record;
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study 2000 UA library record; WoS full record;
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. The influence of crystal thickness on the image tone 2003 Journal of imaging science 47 UA library record; WoS full record; WoS citing articles
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals 2000 UA library record; WoS full record;
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization 2000 UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles