Number of records found: 188
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Citations
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Image-quality evaluation and model selection with maximum a posteriori probability”. Fatermans J, de Backer A, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 215 (2021).
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Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range”. Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D, Physical review letters 96, 096106 (2006). http://doi.org/10.1103/PhysRevLett.96.096106
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Advanced electron microscopy for advanced materials”. Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, van Dyck D, Advanced materials 24, 5655 (2012). http://doi.org/10.1002/adma.201202107
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Effect of amorphous layers on the interpretation of restored exit waves”. Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G, Ultramicroscopy 109, 237 (2009). http://doi.org/10.1016/j.ultramic.2008.10.024
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Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy”. van den Bos KH W, De Backer A, Martinez GT, Winckelmans N, Bals S, Nellist PD, Van Aert S, Physical review letters 116, 246101 (2016). http://doi.org/10.1103/PhysRevLett.116.246101
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A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM”. Van den Broek W, Rosenauer A, Van Aert S, Sijbers J, van Dyck D, Ultramicroscopy 141, 22 (2014). http://doi.org/10.1016/j.ultramic.2014.03.008
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An alternative approach to determine attainable resolution directly from HREM images”. Wang A, Turner S, Van Aert S, van Dyck D, Ultramicroscopy 133, 50 (2013). http://doi.org/10.1016/j.ultramic.2013.05.008
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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Atomic-scale quantification of charge densities in two-dimensional materials”. Müller-Caspary K, Duchamp M, Roesner M, Migunov V, Winkler F, Yang H, Huth M, Ritz R, Simson M, Ihle S, Soltau H, Wehling T, Dunin-Borkowski RE, Van Aert S, Rosenauer A, Physical review B 98, 121408 (2018). http://doi.org/10.1103/PHYSREVB.98.121408
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The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials”. van den Bos KHW, Janssens L, De Backer A, Nellist PD, Van Aert S, Ultramicroscopy 203, 155 (2019). http://doi.org/10.1016/j.ultramic.2018.12.004
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Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films”. Molina-Luna L, Duerrschnabel M, Turner S, Erbe M, Martinez GT, Van Aert S, Holzapfel B, Van Tendeloo G, Superconductor science and technology 28, 115009 (2015). http://doi.org/10.1088/0953-2048/28/11/115009
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Grü,newald L, Chezganov D, De Meyer R, Orekhov A, Van Aert S, Bogaerts A, Bals S, Verbeeck J (2023) Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope”
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Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites”. Fatermans J, Romolini G, Altantzis T, Hofkens J, Roeffaers MBJ, Bals S, Van Aert S, Nanoscale (2022). http://doi.org/10.1039/D2NR01819E
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Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits?”.den Dekker AJ, Gonnissen J, de Backer A, Sijbers J, Van Aert S, Ultramicroscopy 134, 34 (2013). http://doi.org/10.1016/j.ultramic.2013.05.017
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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Atomic scale dynamics of ultrasmall germanium clusters”. Bals S, Van Aert S, Romero CP, Lauwaet K, Van Bael MJ, Schoeters B, Partoens B, Yuecelen E, Lievens P, Van Tendeloo G, Nature communications 3, 897 (2012). http://doi.org/10.1038/ncomms1887
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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images”. Fatermans J, den Dekker A J, Müller-Caspary K, Lobato I, O’Leary C M, Nellist P D, Van Aert S, Physical review letters 121, 056101 (2018). http://doi.org/10.1103/PhysRevLett.121.056101
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Preventing cation intermixing enables 50% quantum yield in sub-15 nm short-wave infrared-emitting rare-earth based core-shell nanocrystals”. Arteaga Cardona F, Jain N, Popescu R, Busko D, Madirov E, Arús BA, Gerthsen D, De Backer A, Bals S, Bruns OT, Chmyrov A, Van Aert S, Richards BS, Hudry D, Nature communications 14, 4462 (2023). http://doi.org/10.1038/s41467-023-40031-4
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Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis”. Rosenauer A, Gerthsen D, Van Aert S, van Dyck D, den Dekker AJ, Institute of physics conference series , 19 (2003)
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Incommensurate modulation and luminescence in the CaGd2(1-x)Eu2x(MoO4)4(1-y)(WO)4y (0\leq x\leq1, 0\leq y\leq1) red phosphors”. Morozov VA, Bertha A, Meert KW, Van Rompaey S, Batuk D, Martinez GT, Van Aert S, Smet PF, Raskina MV, Poelman D, Abakumov AM, Hadermann J;, Chemistry of materials 25, 4387 (2013). http://doi.org/10.1021/cm402729r
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Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM”. Varambhia AM, Jones L, De Backer A, Fauske VT, Van Aert S, Ozkaya D, Nellist PD, Particle and particle systems characterization 33, 438 (2016). http://doi.org/10.1002/ppsc.201600067
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Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis”. Monai M, Jenkinson K, Melcherts AEM, Louwen JN, Irmak EA, Van Aert S, Altantzis T, Vogt C, van der Stam W, Duchon T, Smid B, Groeneveld E, Berben P, Bals S, Weckhuysen BM, Science 380, 644 (2023). http://doi.org/10.1126/SCIENCE.ADF6984
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A method to determine the local surface profile from reconstructed exit waves”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 111, 1352 (2011). http://doi.org/10.1016/j.ultramic.2011.04.005
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The maximum a posteriori probability rule for atom column detection from HAADF STEM images”. Fatermans J, Van Aert S, den Dekker AJ, Ultramicroscopy 201, 81 (2019). http://doi.org/10.1016/j.ultramic.2019.02.003
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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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Model based quantification of EELS spectra”. Verbeeck J, Van Aert S, Ultramicroscopy 101, 207 (2004). http://doi.org/10.1016/j.ultramic.2004.06.004
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High resolution electron tomography”. Bals S, Van Aert S, Van Tendeloo G, Current opinion in solid state and materials science 17, 107 (2013). http://doi.org/10.1016/j.cossms.2013.03.001
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images”. Martinez GT, de Backer A, Rosenauer A, Verbeeck J, Van Aert S, Micron 63, 57 (2014). http://doi.org/10.1016/j.micron.2013.12.009
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