| Records |
| Author |
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
| Title |
Fast electron low dose tomography for beam sensitive materials |
Type |
A1 Journal article |
| Year |
2021 |
Publication |
Microscopy And Microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
27 |
Issue |
S1 |
Pages |
2116-2118 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract  |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
|
Publication Date |
2021-07-30 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276 |
ISBN |
|
Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
|
Open Access |
OpenAccess |
| Notes |
|
Approved |
Most recent IF: 1.891 |
| Call Number |
EMAT @ emat @c:irua:183278 |
Serial |
6813 |
| Permanent link to this record |
| |
|
| |
| Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
| Title |
Physical limits on atomic resolution |
Type |
A1 Journal article |
| Year |
2004 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
10 |
Issue |
|
Pages |
153-157 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
| Language |
|
Wos |
000188882100022 |
Publication Date |
2004-08-11 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.891 |
Times cited |
14 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2004 IF: 2.389 |
| Call Number |
UA @ lucian @ c:irua:47515 |
Serial |
2616 |
| Permanent link to this record |
| |
|
| |
| Author |
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
| Title |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
Type |
A3 Journal article |
| Year |
2004 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
10 |
Issue |
S:2 |
Pages |
294-295 |
| Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
|
Publication Date |
2008-01-04 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
|
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2004 IF: 2.389 |
| Call Number |
UA @ lucian @ c:irua:87599 |
Serial |
2714 |
| Permanent link to this record |
| |
|
| |
| Author |
Bals, S.; Radmilovic, V.; Kisielowski, C. |
| Title |
TEM annular objective apertures fabricated by FIB |
Type |
A1 Journal article |
| Year |
2004 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
10 |
Issue |
S:2 |
Pages |
1148-1149 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
| Language |
|
Wos |
|
Publication Date |
2008-01-04 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
|
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2004 IF: 2.389 |
| Call Number |
UA @ lucian @ c:irua:87603 |
Serial |
3475 |
| Permanent link to this record |
| |
|
| |
| Author |
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
| Title |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
Type |
A1 Journal article |
| Year |
2014 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
20 |
Issue |
S3 |
Pages |
126-127 |
| Keywords |
A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
| Language |
|
Wos |
|
Publication Date |
2014-08-27 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276 |
ISBN |
|
Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
|
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2014 IF: 1.877 |
| Call Number |
UA @ lucian @ c:irua:136445 |
Serial |
4500 |
| Permanent link to this record |
| |
|
| |
| Author |
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. |
| Title |
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation |
Type |
A1 Journal article |
| Year |
2007 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
13 |
Issue |
3 |
Pages |
165-172 |
| Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
000246814100004 |
Publication Date |
2007-05-09 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.891 |
Times cited |
31 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2007 IF: 1.941 |
| Call Number |
UA @ admin @ c:irua:64739 |
Serial |
5721 |
| Permanent link to this record |
| |
|
| |
| Author |
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
| Title |
Novel thin film lift-off process for in situ TEM tensile characterization |
Type |
A1 Journal article |
| Year |
2021 |
Publication |
Microscopy And Microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
27 |
Issue |
S1 |
Pages |
216-217 |
| Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
|
Publication Date |
2021-07-30 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276 |
ISBN |
|
Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
|
Approved |
Most recent IF: 1.891 |
| Call Number |
UA @ admin @ c:irua:183617 |
Serial |
6873 |
| Permanent link to this record |
