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Author Van Aert, S.; van Dyck, D.; den Dekker, A.J. url  doi
openurl 
  Title Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative Type A1 Journal article
  Year 2006 Publication Optics express Abbreviated Journal Opt Express  
  Volume 14 Issue 9 Pages 3830-3839  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000237296200013 Publication Date 2006-05-04  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1094-4087; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 3.307 Times cited 45 Open Access  
  Notes Fwo Approved Most recent IF: 3.307; 2006 IF: 4.009  
  Call Number UA @ lucian @ c:irua:58262 Serial 2883  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. doi  openurl
  Title Statistical experimental design for quantitative atomic resolution transmission electron microscopy Type H1 Book chapter
  Year 2004 Publication Abbreviated Journal Adv Imag Elect Phys  
  Volume Issue Pages 1-164  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Academic Press Place of Publication San Diego, Calif. Editor  
  Language Wos 000223226700001 Publication Date 2011-01-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1076-5670; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 13 Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:47513 Serial 3156  
Permanent link to this record
 
 
Author Van Aert, S. isbn  openurl
  Title Statistical parameter estimation theory : a tool for quantitative electron microscopy Type H1 Book chapter
  Year 2012 Publication Abbreviated Journal  
  Volume Issue Pages 281-309  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT)  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Wiley-VCH Place of Publication Weinheim Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-527-31706-6 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:96693 Serial 3159  
Permanent link to this record
 
 
Author Batenburg, J.; Van Aert, S. pdf  openurl
  Title Three-dimensional reconstruction of a nanoparticle at atomic resolution Type A2 Journal article
  Year 2011 Publication ERCIM news Abbreviated Journal  
  Volume 86 Issue Pages 52  
  Keywords A2 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Le Chesnay Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0926-4981 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:94120 Serial 3655  
Permanent link to this record
 
 
Author Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. doi  openurl
  Title Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM Type A1 Journal article
  Year 2014 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 20 Issue S3 Pages 126-127  
  Keywords A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT)  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos Publication Date 2014-08-27  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276 ISBN Additional Links UA library record  
  Impact Factor 1.891 Times cited Open Access  
  Notes Approved Most recent IF: 1.891; 2014 IF: 1.877  
  Call Number UA @ lucian @ c:irua:136445 Serial 4500  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. doi  isbn
openurl 
  Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
  Year 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal  
  Volume Issue Pages 2081-2086  
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Ieee Place of Publication Editor  
  Language Wos Publication Date 2002-11-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 0-7803-6646-8 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:136870 Serial 4501  
Permanent link to this record
 
 
Author Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. doi  isbn
openurl 
  Title The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data Type H1 Book chapter
  Year 2008 Publication Abbreviated Journal  
  Volume Issue Pages 97-98  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 2009-03-17  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-540-85154-7 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:136865 Serial 4493  
Permanent link to this record
 
 
Author Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. doi  openurl
  Title Investigating lattice strain in Au nanodecahedrons Type P1 Proceeding
  Year 2016 Publication Abbreviated Journal  
  Volume Issue Pages 11-12  
  Keywords P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (down)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 2016-12-21  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 978-3-527-80846-5 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access Not_Open_Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:145813 Serial 5144  
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