Number of records found: 336
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Citations
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Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials”. Schryvers D, Cao S, Tirry W, Idrissi H, Van Aert S, Science and technology of advanced materials 14, 014206 (2013). http://doi.org/10.1088/1468-6996/14/1/014206
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Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy”. Lu J, Martinez GT, Van Aert S, Schryvers D, Physica status solidi: B: basic research 251, 2034 (2014). http://doi.org/10.1002/pssb.201350351
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Effect of annealing on the transformation behavior and mechanical properties of two nanostructured Ti-50.8at.%Ni thin wires produced by different methods”. Wang X, Amin-Ahmadi B, Schryvers D, Verlinden B, Van Humbeeck J, Materials science forum 738/739, 306 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.306
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Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy”. Heidari H, Rivero G, Idrissi H, Ramachandran D, Cakir S, Egoavil R, Kurttepeli M, Crabbé, AC, Hauffman T, Terryn H, Du Prez F, Schryvers D, Microscopy and microanalysis 22, 1222 (2016). http://doi.org/10.1017/S1431927616012484
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Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Idrissi H, Schryvers D, Salje EKH, Zhang H, Carpenter MA, Moya X, , 02029 (2009). http://doi.org/10.1051/esomat/200902029
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Mechanical resonance of the austenite/martensite interface and the pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Salje EKH, Zhang H, Idrissi H, Schryvers D, Carpenter MA, Moya X, Planes A, Physical review: B: condensed matter and materials physics 80, 134114 (2009). http://doi.org/10.1103/PhysRevB.80.134114
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Transmission electron microscopy investigation of microstructures in low-hysteresis alloys with special lattice parameters”. Delville R, Schryvers D, Zhang Z, James RD, Scripta materialia 60, 293 (2009). http://doi.org/10.1016/j.scriptamat.2008.10.025
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Positron annihilation study of nanocrystalline Ni3Al : simulations and measurements”. Kuriplach J, van Petegem S, Hou M, Van Tendeloo G, Schryvers D, et al, Materials science forum T2 –, 12th International Conference on Positron Annihilation (ICPA-12), AUG 06-12, 2000, UNIV BUNDERSWEHR MUNCHEN, NEUBIBERG, GERMANY 363-3, 94 (2001)
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Triple ion beam cutting of diamond/Al composites for interface characterization”. Ji G, Tan Z, Shabadi R, Li Z, Grünewald W, Addad A, Schryvers D, Zhang D, Materials characterization 89, 132 (2014). http://doi.org/10.1016/j.matchar.2014.01.008
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Novel class of nanostructured metallic glass films with superior and tunable mechanical properties”. Ghidelli M, Orekhov A, Bassi AL, Terraneo G, Djemia P, Abadias G, Nord M, Béché, A, Gauquelin N, Verbeeck J, Raskin J-p, Schryvers D, Pardoen T, Idrissi H, Acta Materialia , 116955 (2021). http://doi.org/10.1016/j.actamat.2021.116955
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Optimization of Automated Crystal Orientation and Phase Mapping in TEM Applied to Ni-Ti All Round Shape Memory Alloy”. Yao X, Li Y, Cao S, Ma X, Zhang X-ping, Schryvers D, MATEC web of conferences T2 –, Proceedings of ESOMAT 2015 10th European Symposium on Martensitic Transformations, September 14-18, 2015, Antwerp, Belgium 33, 03022 (2015). http://doi.org/10.1051/matecconf/20153303022
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A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects”. Pardoen T, Colla M-S, Idrissi H, Amin-Ahmadi B, Wang B, Schryvers D, Bhaskar UK, Raskin J-P, Comptes rendus : physique 17, 485 (2016). http://doi.org/10.1016/j.crhy.2015.11.005
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Compositional characterization of nickel silicides by HAADF-STEM imaging”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of materials science 46, 2001 (2011). http://doi.org/10.1007/s10853-010-5191-z
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Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires”. Pourbabak S, Orekhov A, Schryvers D, Microscopy Research And Technique , 1 (2020). http://doi.org/10.1002/JEMT.23588
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Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
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Fabrication and characterization of functionally graded Ni-Ti multilayer thin films”. Tian H, Schryvers D, Mohanchandra KP, Carman GP, van Humbeeck J, Functional materials letters 2, 61 (2009). http://doi.org/10.1142/S1793604709000570
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Interfacial characteristics and cohesion mechanisms of linear friction welded dissimilar titanium alloys: Ti–5Al–2Sn–2Zr–4Mo–4Cr (Ti17) and Ti–6Al–2Sn–4Zr–2Mo (Ti6242)”. Boyat X, Ballat-Durand D, Marteau J, Bouvier S, Favergeon J, Orekhov A, Schryvers D, Materials characterization 158, 109942 (2019). http://doi.org/10.1016/j.matchar.2019.109942
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R-phase transition and related mechanical properties controlled by low-temperature aging treatment in a Ti50.8 at.% Ni thin wire”. Wang X, Li K, Schryvers D, Verlinden B, Van Humbeeck J, Scripta materialia 72-73, 21 (2014). http://doi.org/10.1016/j.scriptamat.2013.10.006
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Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM”. Oleshko V, Schryvers D, Gijbels R, Jacob W s.l., page 293 (1998).
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Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Verbeeck J, Physical review : B : condensed matter and materials physics 64, 184110 (2001). http://doi.org/10.1103/PhysRevB.64.184110
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ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles”. Cautaerts N, Delville R, Schryvers D, Journal of microscopy 273, 189 (2019). http://doi.org/10.1111/jmi.12774
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3D reconstruction of a Ni51Ti49 alloy with precipitates by FIB-SEM alice-and-view”. Cao S, Tirry W, Schryvers D, Materia Japan 46, 803 (2007)
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Advanced TEM studies of martensite and related phase transformations”. Schryvers D s.l., page 947 (1999).
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Analytical TEM investigations on concentration gradients surrounding Ni4Ti3 precipitates in Ni-Ti shape memory material”. Yang Z, Tirry W, Schryvers D, Scripta materialia 52, 1129 (2005). http://doi.org/10.1016/j.scriptamat.2005.02.013
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The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations”. Fredrickx P, Wouters J, Schryvers D Archetype, London, page 137 (2003).
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Applications of advanced transmission electron microscopic techniques to Ni-Ti based shape memory materials”. Schryvers D, Potapov P, Santamarta R, Tirry W, Materials science and engineering: part A: structural materials: properties, microstructure and processing 378, 11 (2004). http://doi.org/10.1016/j.msea.2003.10.325
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Atomic scale characterization of supported and assembled nanoparticles”. Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Verschoren G, Lievens P, Hou M, van Swygenhoven H, , B8.3 (2001)
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Atomic scale modeling of supported and assembled nanoparticles”. Zhurkin E, Hou M, van Swygenhoven H, Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Lievens P, Verschoren G, Kuriplach J, van Peteghem S, Segers D, Dauwe C, , B8.2 (2001)
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Atomic structure of alloys close to phase transitions”. Van Tendeloo G, Schryvers D, Nucleation and growth processes in materials 580, 283 (2000)
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Austenite and martensite microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Intermetallics 6, 427 (1998). http://doi.org/10.1016/S0966-9795(97)00091-5
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