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Author Title Year Publication Volume Times cited Additional Links
Heidari, H.; van den Broek, W.; Bals, S. Quantitative electron tomography : the effect of the three-dimensional point spread function 2013 Ultramicroscopy 135 6 UA library record; WoS full record; WoS citing articles
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Applying an information transmission approach to extract valence electron information from reconstructed exit waves 2011 Ultramicroscopy 111 1 UA library record; WoS full record; WoS citing articles
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles
Radtke, G.; Botton, G.A.; Verbeeck, J. Electron inelastic, scattering and anisotropy: the two-dimensional point of view 2006 Ultramicroscopy 106 5 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. On the interpretation of HREM images of partially ordered alloys 1995 Ultramicroscopy 60 20 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations 2017 Ultramicroscopy 176 1 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Verbeeck, J. Theory of free electron vortices 2011 Ultramicroscopy 111 57 UA library record; WoS full record; WoS citing articles
Béché, A.; Juchtmans, R.; Verbeeck, J. Efficient creation of electron vortex beams for high resolution STEM imaging 2017 Ultramicroscopy 178 30 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. Real space maps of magnetic moments on the atomic scale: theory and feasibility 2010 Ultramicroscopy 110 10 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. Optimal aperture sizes and positions for EMCD experiments 2008 Ultramicroscopy 108 27 UA library record; WoS full record; WoS citing articles
Madsen, J.; Pennycook, T.J.; Susi, T. ab initio description of bonding for transmission electron microscopy 2021 Ultramicroscopy 231 UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves : part 2 : a practical example 2012 Ultramicroscopy 116 8 UA library record; WoS full record; WoS citing articles
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles
Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. Oxidation state and chemical shift investigation in transition metal oxides by EELS 2012 Ultramicroscopy 116 413 UA library record; WoS full record; WoS citing articles
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. Scanning transmission electron microscopy under controlled low-pressure atmospheres 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. Experiments on inelastic electron holography 2006 Ultramicroscopy 106 28 UA library record; WoS full record; WoS citing articles
Niermann, T.; Verbeeck, J.; Lehmann, M. Creating arrays of electron vortices 2014 Ultramicroscopy 136 9 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Löffler, S.; Stöger-Pollach, M.; Verbeeck, J. Is magnetic chiral dichroism feasible with electron vortices? 2014 Ultramicroscopy 136 64 UA library record; WoS full record; WoS citing articles
Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. Nanowire facilitated transfer of sensitive TEM samples in a FIB 2020 Ultramicroscopy 219 UA library record
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles
De wael, A.; De Backer, A.; Van Aert, S. Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations 2020 Ultramicroscopy 219 UA library record; WoS full record; WoS citing articles
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles
Bertoni, G.; Verbeeck, J. Accuracy and precision in model based EELS quantification 2008 Ultramicroscopy 108 44 UA library record; WoS full record; WoS citing articles