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Author | Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R. | ||||
Title | Conventional and HREM study of structural defects in nanostructured silver halides | Type | P3 Proceeding | ||
Year | 1998 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 1-6 | ||
Keywords | P3 Proceeding; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Antwerpen | Editor | ||
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title ![]() |
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Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:29681 | Serial | 509 | ||
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