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Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 682 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.682
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