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“Scanning XRF investigation of a Flower Still Life and its underlying composition from the collection of the Kröller-Muller Museum”. Alfeld M, van der Snickt G, Vanmeert F, Janssens K, Dik J, Appel K, van der Loeff L, Chavannes M, Meedendorp T, Hendriks E, Applied physics A : materials science &, processing 111, 165 (2013). http://doi.org/10.1007/S00339-012-7526-X
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.455
Times cited: 35
DOI: 10.1007/S00339-012-7526-X
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“The use of full-field XRF for simultaneous elemental mapping”. Alfeld M, Janssens K, Sasov A, Liu X, Kostenko A, Rickers-Appel K, Falkenberg G, , 111 (2010). http://doi.org/10.1063/1.3399236
Abstract: The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments.
Keywords: P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Times cited: 8
DOI: 10.1063/1.3399236
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