Kempenaers, L.; Janssens, K.; Jochum, K.P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F. |
Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF |
2003 |
Journal of analytical atomic spectrometry |
18 |
38 |
UA library record; WoS full record; WoS citing articles |