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Author | Van Aert, S. | ||||
Title | Statistical parameter estimation theory : a tool for quantitative electron microscopy | Type | H1 Book chapter | ||
Year | 2012 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 281-309 | ||
Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Wiley-VCH | Place of Publication | Weinheim | Editor | |
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title ![]() |
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Series Volume | Series Issue | Edition | |||
ISSN | ISBN | 978-3-527-31706-6 | Additional Links | UA library record | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:96693 | Serial | 3159 | ||
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