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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
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“Observations of intermetallic compound formation of hot dip aluminized steel”. Kee-Hyun K, van Daele B, Van Tendeloo G, Jong-Kyu Y, Aluminium alloys: part 1-2 519-521, 1871 (2006)
Abstract: A hot dip aluminizing process to simulate the continuous galvanizing line (CGL) was carried out in three successive steps by a hot dip simulator: the pre-treatment for removing scales on the 200 x 250 mm(2) and 1mm in thickness cold rolled steel sheet, the dipping in 660 degrees C Al-Si melt for 3s and the cooling. In a pre-treatment, the steel specimen was partly coated by Au to confirm the mechanism of intermetallic compound (IMC) formation. Scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), and transmission electron microscopy (TEM) analyses were followed to observe the cross-section and the distribution of the elements. The specimen was analyzed in the boundary of the dipped-undipped part to see the formation mechanism of the aluminized steel. An intermetallic compound (IMC) is rapidly developed and grown in the steel-liquid interface. It has been usually reported that the IMC was formed by the dissolution of iron in the steel substrate toward the melt and the diffusion of aluminum in an opposite direction. The specimen is covered with aluminum-10 wt.% silicon, forms the IMC in the part that was not Au coated. However, IMC is not formed in the Au-coated part. The interface of the dipped-undipped is also analyzed by EDX. At the interface of the steel-IMC, it is clearly shown that the IMC is only formed in the dipped part and exists in the steel substrate as well, and contributes by iron, aluminum and silicon. The result clearly shows that only aluminum diffuses into the steel substrate without the dissolution of iron and forms the IMC between the steel substrate and the melt. Au coating and the short dipping time prevent the iron from dissolving into the aluminum melt. By TEM combined with focused ion beam (FIB) sample preparation, the IMC is confirmed as Fe2SiAl8, a hexagonal structure with space group P6(3)/mmc.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
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“Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 249/251, 476 (1998)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
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“Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 12th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS), Tokyo, 835 (1997)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
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“Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Idrissi H, Schryvers D, Salje EKH, Zhang H, Carpenter MA, Moya X, , 02029 (2009). http://doi.org/10.1051/esomat/200902029
Abstract: A single crystal of Cu74.08Al23.13Be2.79 undergoes a martensitic phase transition at 246K and 232K under heating and cooling, respectively. Surprisingly, the martensite phase is elastically much harder than the austenite phase showing that interfaces between various crystallographic variants are strongly pinned and can not be moved by external stress while the phase boundary between the austenite and martensite regions in the sample remains mobile. This unusual behavior was revealed by Dynamical Mechanical Analysis and Resonant Ultrasound Spectroscopy. Transmission Electron Microscopy shows that the pinning is generated by dislocations, which are inherited from the austenite phase. Such dislocations can hinder the movement of stacking faults in the 18R martensite structure or twin boundaries between martensite variants.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 2
DOI: 10.1051/esomat/200902029
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“Positron annihilation study of nanocrystalline Ni3Al : simulations and measurements”. Kuriplach J, van Petegem S, Hou M, Van Tendeloo G, Schryvers D, et al, Materials science forum
T2 –, 12th International Conference on Positron Annihilation (ICPA-12), AUG 06-12, 2000, UNIV BUNDERSWEHR MUNCHEN, NEUBIBERG, GERMANY 363-3, 94 (2001)
Abstract: A positron lifetime experiment is performed on samples produced by the compaction of nanocrystalline Ni3Al powder synthesized by the inert-gas condensation technique. In the lifetime spectrum we observe two components corresponding to defects. Computer (virtual) samples of n-Ni3Al are obtained using molecular dynamics combined with the Metropolis Monte Carlo technique. Positron lifetime calculations are then performed on selected regions of simulated samples. For this purpose, a new computational technique based on a generalization of the atomic superposition method for non-periodic systems was developed. Lifetimes calculated in this way are compared to experiment.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Precipitation behavior in Cu-Co alloy”. Takeda M, Shinohara G, Yamada H, Yoshida S, van Landuyt J, Hashimoto H, , 205 (1998)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
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“Preparation of nanocrystalline titania powder by aerosol pyrolysis of titanium alkoxide”. Ahonen PP, Kauppinen EI, Deschanvres JL, Joubert JC, Van Tendeloo G, Materials Research Society symposium proceedings 520, 109 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 2
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“Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis”. Rosenauer A, Gerthsen D, Van Aert S, van Dyck D, den Dekker AJ, Institute of physics conference series , 19 (2003)
Abstract: Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
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“Production and structure of exfoliated graphite/coke composites modified by ZrO2 nanoparticles”. Afanasov IM, Van Tendeloo G, Mateev AT, New carbon materials 25, 255 (2010). http://doi.org/10.1016/S1872-5805(09)60032-9
Abstract: Exfoliated graphite/coke composites modified by ZrO2 nanoparticles were produced using two different techniques and characterized by means of X-ray diffraction, scanning and transmission electron microscopy. In the first, low-density exfoliated graphite/coke blocks were dipped repeatedly and alternately in ZrO(NO3)2 and NH4OH solutions and subsequently heat treated at 1200°C in nitrogen to deposit thin layers of ZrO2 nanoparticles on the free surfaces of the carbon matrix. In the second, a mixture of expandable graphite, phenol-formaldehyde resin powder, and ZrOC2O4-modified fibrous cellulose in a sealed container was submitted to thermal shock at 900 °C followed by heat treatment at 1 200 °C in nitrogen to obtain the modified composites. The ZrO2 nanoparticles formed in the second technique were incorporated into the composites in three length scales: 6-30 nm-isolated nanoparticles and small blobs, 200-1000 nm-lengthy dendrite-like structures, and thin layer adhering to the surface of the 1-40 μm long cellulose carbon fibers.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
DOI: 10.1016/S1872-5805(09)60032-9
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Cao S (2010) Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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Wang W-C (2011) Quantitative analysis of electron exit waves with single atom sensitivity. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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“Quantitative EFTEM study of germanium quantum dots”. Hens S, Stuer C, Bender H, Loo R, van Landuyt J, , 345 (2001)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT); Engineering Management (ENM)
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“Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
Abstract: Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction”. Müller K, Schowalter M, Rosenauer A, Jansen J, Tsuda K, Titantah JT, Lamoen D, Journal of physics : conference series 209, 012025 (2010). http://doi.org/10.1088/1742-6596/209/1/012025
Abstract: We introduce a new method to measure structure factors from parallel beam electron diffraction (PBED) patterns. Bloch wave refinement routines were developed which can minimise the difference between simulated and experimental Bragg intensities via variation of structure factors, Debye parameters, specimen thickness and -orientation. Due to plane wave illumination, the PBED refinement is highly efficient not only in computational respect, but also concerning the experimental effort since energy filtering is shown to have no significant effect on the refinement results. The PBED method was applied to simulated GaAs diffraction patterns to derive systematic errors and rules for the identification of plausible refinement results. The evaluation of experimental GaAs PBED patterns yields a 200 X-ray structure factor of -6.33±0.14. Additionally, we obtained -6.35±0.13 from two-dimensional convergent beam electron diffraction refinements. Both results confirm density functional theory calculations published by Rosenauer et al. and indicate the inaccuracy of isolated atom scattering data, which is crucial e.g. for the composition evaluation by lattice fringe analysis.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
DOI: 10.1088/1742-6596/209/1/012025
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“Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 5
DOI: 10.1109/IPFA.2002.1025629
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“Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA)
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“Single crystalline GaN grown on porous Si(111) by MOVPE”. Cheng K, Degroote S, Leys M, van Daele B, Germain M, Van Tendeloo G, Borghs G, Physica status solidi: C: conferences and critical reviews 4, 1908 (2007). http://doi.org/10.1002/pssc.200674316
Abstract: In this work, GaN growth on porous Si(111) will be reported. The porosity of the substrates was 30% or 50%. In the latter case, various thicknesses, from 0.6 mu m to 10 mu m, were investigated. The morphology of the GaN surfaces was analyzed by optical interference microscopy. The crystalline quality of the epitaxial layers was characterized by High Resolution X-Ray Diffraction (HR-XRD) and cross-sectional Transmission Electron Microscopy (TEM). A Full Width at Half Maximum (FWHM) of the X-ray symmetric rocking curve (0002) 2 theta – omega scan of 290 arc see was obtained for a 1 mu m thick GaN layer, which is comparable with that of GaN grown on bulk Si(111) substrates. (c) 2007 WILEY-VCH Verlag GmbH Co. KGaA, Weinheim.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 2
DOI: 10.1002/pssc.200674316
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“Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
Abstract: Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias-voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 131
DOI: 10.1186/s40679-015-0008-4
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“Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis”. Delville R, Shi H, James RD, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 105 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.105
Abstract: The breaking of symmetry due to atomic displacements in the austenite-martensite phase transformation generally leads to their crystallographic incompatibility. Energy minimizing accommodation mechanisms such as martensite twinning have been recently shown to be a source of hysteresis and irreversible plastic deformation. Compatibility between the two phases can however be achieved by carefully tuning lattice parameters through composition change. A dramatic drop in hysteresis and novel microstructures such as a lowering of the amount of twin lamella are then observed. Related theoretical and simulation works also support the existence of such microstructures including peculiar self-accommodating configurations at near-compatibility. We present the transmission electron microscopy (TEM) study of these novel microstructures for the alloy systems Ti50Ni50-xPdx and Ti50Ni50-xAux where the composition was systemically tuned to approach perfect compatibility. High resolution imaging of the interface between austenite and martensite supplies evidences of compatibility at the atomic level.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 3
DOI: 10.4028/www.scientific.net/SSP.172-174.105
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“Stability of vortex-antivortex “molecules&rdquo, in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, 3rd International Symposium on Mesoscopic Superconductivity and, Spintronics, MAR 01-04, 2004, Atsug, 191 (2005). http://doi.org/10.1142/9789812701619_0030
Abstract: We have revealed thermodynamically stable vortex-antivortex configurations in mesoscopic type I superconducting equilateral triangles. The revealed effect is explained by two factors: (i) vortex confinement in mesoscopic triangles and (ii) appearance of the vortex-antivortex repulsion in mesoscopic type I superconductor triangles in the vicinity of the dual point. The stability of the obtained solutions is examined as a function of material and external parameters – the Ginzburg-Landau parameter K and temperature – as well as a function of a distortion of the sample's shape. The vortex-antivortex. “molecule” turns out to be stable in a wide range of the parameters that makes it possible its experimental visualization.
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
DOI: 10.1142/9789812701619_0030
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“Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab
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“Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT)
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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