Number of records found: 980
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Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
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Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields”. Wang YJ, Nickel HA, McCombe BD, Peeters FM, Hai GQ, Shi JM, Devreese JT, Wu XG, , 797 (1997)
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Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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A self-consistent mathematical model of a hollow cathode glow discharge”. Baguer N, Bogaerts A, Gijbels R, , 157 (1999)
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Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification”. Gijbels R, Verlinden G, Geuens I London Institute of Physics, Bristol, page 331 (2000).
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Simulation of plasma processes in plasma assisted CVD reactors”. Herrebout D, Bogaerts A, Goedheer W, Dekempeneer E, Gijbels R, , 213 (1999)
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Sputtering of Si(001) and SiC(001) by grazing ion bombardment”. Elmonov AA, Yusupov MS, Dzhurakhalov AA, Bogaerts A, , 209 (2008)
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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Stress analysis with convergent beam electron diffraction around NMOS transistors”. Stuer G, Bender H, van Landuyt J, Eyben P, , 359 (2001)
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Nasr Esfahani D (2014) Strongly correlated electronic systems : influence of electric field and doping. Antwerpen
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Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film”. Lebedev O, Verbeeck J, Van Tendeloo G, Shapoval O, Belenchuk A, Moshnyaga V, Damaschke B, Samwer K s.l., page 1013 (2002).
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Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
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Galvá,n Moya JE (2014) Structural properties of classical quasi-one-dimensional crystals and three-dimensional clusters. Antwerpen
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Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques”. Oleshko VP, van Daele AJ, Gijbels RH, Jacob WA, , 659 (1998)
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Muñ,oz WA (2014) Superconducting correlations in single and multilayer graphene. Antwerpen
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Superconducting nanowires : new type of BCS-BEC crossover driven by quantum-size effects”. Shanenko AA, Croitoru MD, Vagov A, Peeters FM, , 119 (2011). http://doi.org/10.1007/978-94-007-0044-4_9
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Superconducting nanowires: quantum-confinement effect on the critical magnetic field and supercurrent”. Croitoru MD, Shanenko AA, Peeters FM, , 327 (2010). http://doi.org/10.1142/9789814289153_0025
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Chen Y (2012) Superconductivity in nanofilms and nanocylinders. Antwerpen
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Superconductivity in the quantum-size regime”. Shanenko AA, Croitoru MD, Peeters FM, , 79 (2008)
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Brox O, Benninghoven A, Geuens I, de Keyzer R, (1997)
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