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  Author Title Year Publication Volume Times cited Additional Links Links
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation 1999 Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND UA library record; WoS full record;
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Structural characterisation of erbium silicide thin films of an Si(111) substrate 1996 Journal of alloys and compounds 234 14 UA library record; WoS full record; WoS citing articles pdf doi
Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.; Effect of powder coating on stabilizer distribution in CeO2-stabilized ZrO2 ceramics 2005 Journal of the American Ceramic Society 88 11 UA library record; WoS full record; WoS citing articles doi
Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines 2001 Journal of applied physics 90 97 UA library record; WoS full record; WoS citing articles pdf doi
Ignatova, V.A.; Lebedev, O.I.; Watjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions 2002 Journal of applied physics 92 5 UA library record; WoS full record; WoS citing articles pdf doi
Gryse, O.D.; Clauws, P.; van Landuyt, J.; Lebedev, O.; Claeys, C.; Simoen, E.; Vanhellemont, J. Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques 2002 Journal of applied physics 91 27 UA library record; WoS full record; WoS citing articles pdf doi
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. A 2a2b3c superstructure in hexagonal NiS1-x: a study by means of electron diffraction and HREM 1993 Journal of crystal growth 126 4 UA library record; WoS full record; WoS citing articles
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J. A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM 1993 Journal of crystal growth 126 4 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J. Carbon nano-tubes: their formation process and observation by electron microscopy 1993 Journal of crystal growth 130 190 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J. Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”? 1992 Journal of crystal growth 121 43 UA library record; WoS full record; WoS citing articles doi
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. Defects and growth mechanisms of AgCl(100) tabular crystals 1998 Journal of crystal growth 187 8 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. Electron microscopical investigation of AgBr needle crystals 1995 Journal of crystal growth 151 14 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals 1997 Journal of crystal growth 172 15 UA library record; WoS full record; WoS citing articles
Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study 1997 Journal of crystal growth 181 9 UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction 1997 Journal of crystal growth 172 29 UA library record; WoS full record; WoS citing articles
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 1997 Journal of crystal growth 172 23 UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy 2004 Journal of the electrochemical society 151 13 UA library record; WoS full record; WoS citing articles pdf doi
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G. Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures 2001 Journal of the electrochemical society 148 13 UA library record; WoS full record; WoS citing articles pdf doi
Xu, T.; Wang, P.; Fang, P.; Kan, Y.; Chen, L.; Vleugels, J.; Van der Biest, O.; van Landuyt, J. Phase assembly and microstructure of CeO2-doped ZrO2 ceramics prepared by spark plasma sintering 2005 Journal of the European Ceramic Society 25 13 UA library record; WoS full record; WoS citing articles doi
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals 1996 The journal of imaging science and technology 40 4 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. The influence of crystal thickness on the image tone 2003 Journal of imaging science 47 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. Influence of twinning on the morphology of AgBr and AgCl microcrystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views 1997 The journal of imaging science and technology 41 1 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
Ghica, C.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates 2001 Journal of materials research 16 4 UA library record; WoS full record; WoS citing articles doi
Nistor, L.C.; van Landuyt, J. Structural studies of diamond thin films grown from the arc plasma 1998 Journal of materials research 12 13 UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Gyorgy, E.; Luches, A.; Martino, M.; Nistor, L.C.; van Landuyt, J.; Hermann, J. The study of a crater forming on the surface of a Ti target submitted to multipulse excimer laser irradiation under low pressure N2 1996 Journal of modern optics 43 11 UA library record; WoS full record; WoS citing articles doi
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D. Colloid size distributions in ion implanted glass 1993 Journal of non-crystalline solids 162 63 UA library record; WoS full record; WoS citing articles doi
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