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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W. |
Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides |
1998 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; van Daele, A. |
Cryo-electron spectroscopic imaging, electron energy-loss spectroscopy and energy-dispersive X-ray analysis of Ag(Br,I) nano- and microcrystals |
1998 |
Mikrochimica acta: supplementum |
15 |
|
UA library record; WoS full record; |
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Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
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UA library record; WoS full record; |
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Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
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Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers |
2000 |
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UA library record |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
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UA library record; WoS full record; |
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Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Hristov, V.; Gijbels, R. |
Hydrochemical characteristics of geothermal systems in South Bulgaria |
1997 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
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UA library record |
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Vanwelkenhuysen, I.; Gijbels, R.; Geuens, I. |
Influence of the temperature on the morphology of silver behenate microcrystals |
1998 |
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UA library record |
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Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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UA library record |
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Oleshko, V.; Schryvers, D.; Gijbels, R.; Jacob, W. |
Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM |
1998 |
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UA library record |
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Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Investigation of the electron distribution functions in low pressure electron cyclotron resonance discharges |
1999 |
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UA library record; WoS full record; |
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Migoun, A.; Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Ionization density in hydrocarbon flames: numerical modelling |
2004 |
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UA library record |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Langmuir probe diagnostic of high pressure plasmas: study by PIC-MC modelling |
2004 |
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UA library record |
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van Vaeck, L.; van Roy, W.; Struyf, H.; Poels, K.; Gijbels, R. |
Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds |
1997 |
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UA library record |
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Mihailova, D.; Grozeva, M.; Bogaerts, A.; Gijbels, R.; Sabotinov, N. |
Longitudinal hollow cathode copper ion laser: optimization of excitation and geometry |
2003 |
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UA library record; WoS full record; WoS citing articles |
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Gijbels, R. |
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces |
2003 |
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UA library record |
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Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharge plasmas with copper cathode |
2002 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
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de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
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UA library record |
|
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Gijbels, R.; Bogaerts, A. |
Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations |
1997 |
Spectroscopy |
9 |
|
UA library record |
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