List View
 |   | 
   web
Author Title Year Publication Volume Times cited Additional Links
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate 2000 UA library record
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration 2005 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Handbook of microscopy: applications in materials science, solid-state physics and chemistry 1997 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
van Dyck, D.; Van Aert, S.; Croitoru, M.D. Obstacles on the road towards atomic resolution tomography 2005 Microscoy and microanalysis 11 UA library record
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Icem 13 UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. Modification of the multislice method for calculating coherent STEM images 1995 Physica status solidi: A: applied research 150 5 UA library record; WoS full record; WoS citing articles
Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. A peculiar diffraction effect in FCC crystals of C60 1992 Physica status solidi: A: applied research 131 13 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. Towards quantitative high resolution electron microscopy? 1995 Institute of physics conference series 147 UA library record; WoS full record;
Proost, K.; Schalm, O.; Janssens, K.; Van Dyck, D. Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments 2005 UA library record