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  Author Title Year Publication Volume Times cited Additional Links Links
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. Exploring possibilities of band gap measurement with off-axis EELS in TEM 2018 Ultramicroscopy 189 7 UA library record; WoS full record; WoS citing articles pdf url doi
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence 2018 Ultramicroscopy 190 1 UA library record; WoS full record; WoS citing articles pdf url doi
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