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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Korneychuk, S.
;
Partoens, B.
;
Guzzinati, G.
;
Ramaneti, R.
;
Derluyn, J.
;
Haenen, K.
;
Verbeeck, J.
Exploring possibilities of band gap measurement with off-axis EELS in TEM
2018
Ultramicroscopy
189
7
UA library record
;
WoS full record
;
WoS citing articles
Grieb, T.
;
Krause, F.F.
;
Schowalter, M.
;
Zillmann, D.
;
Sellin, R.
;
Müller-Caspary, K.
;
Mahr, C.
;
Mehrtens, T.
;
Bimberg, D.
;
Rosenauer, A.
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence
2018
Ultramicroscopy
190
1
UA library record
;
WoS full record
;
WoS citing articles
