toggle visibility
Search within Results:
Display Options:
Number of records found: 2704

Select All    Deselect All
 | 
Citations
 | 
   print
Plasma-catalytic methanol synthesis from CO₂, hydrogenation over a supported Cu cluster catalyst : insights into the reaction mechanism”. Cui Z, Meng S, Yi Y, Jafarzadeh A, Li S, Neyts EC, Hao Y, Li L, Zhang X, Wang X, Bogaerts A, Acs Catalysis 12, 1326 (2022). http://doi.org/10.1021/ACSCATAL.1C04678
toggle visibility
Atomic-level understanding for the enhanced generation of hydrogen peroxide by the introduction of an aryl amino group in polymeric carbon nitrides”. Zhang T, Schilling W, Khan SU, Ching HYV, Lu C, Chen J, Jaworski A, Barcaro G, Monti S, De Wael K, Slabon A, Das S, Acs Catalysis 11, 14087 (2021). http://doi.org/10.1021/ACSCATAL.1C03733
toggle visibility
Direct visualization of atomic-scale heterogeneous structure dynamics in MnO₂, nanowires”. Peng X, Peng H, Zhao K, Zhang Y, Xia F, Lyu J, Van Tendeloo G, Sun C, Wu J, Acs Applied Materials &, Interfaces 13, 33644 (2021). http://doi.org/10.1021/ACSAMI.1C07929
toggle visibility
Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
toggle visibility
Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
toggle visibility
Direct observation of layer-stacking and oriented wrinkles in multilayer hexagonal boron nitride”. Chen L, Elibol K, Cai H, Jiang C, Shi W, Chen C, Wang HS, Wang X, Mu X, Li C, Watanabe K, Taniguchi T, Guo Y, Meyer JC, Wang H, 2d Materials 8, 024001 (2021). http://doi.org/10.1088/2053-1583/ABD41E
toggle visibility
2-D rotational invariant multi sub band Schrödinger-Poisson solver to model nanowire transistors”. Sels D, Sorée B, Groeseneken G, 14th International Workshop on Computational Electronics, 85 (2010)
toggle visibility
2D semiconductors at the Leuven pulsed field facility”. Bogaerts R, de Keyser A, van Bockstal L, van der Burgt M, van Esch A, Provoost R, Silverans R, Herlach F, Swinnen B, van de Stadt AFW, Koenraad PM, Wolter JH, Karavolas VC, Peeters FM, van de Graaf W, Borghs G, Physicalia magazine 19, 229 (1997)
toggle visibility
3D reconstruction of a Ni51Ti49 alloy with precipitates by FIB-SEM alice-and-view”. Cao S, Tirry W, Schryvers D, Materia Japan 46, 803 (2007)
toggle visibility
65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang”. Lichte H, Dunin-Borkowski R, Tillmann K, Van Aert S, Van Tendeloo G Amsterdam (2013).
toggle visibility
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
toggle visibility
Lobato I (2014) Accurate modeling of high angle electron scattering. Antwerpen
toggle visibility
Amin-Ahmadi B (2015) Adanced TEM investigation of the elementary plsticity mechanisms in palladium thin films at the nano scale. Antwerpen
toggle visibility
Goris B (2014) Advanced electron tomography : 3 dimensional structural characterisation of nanomaterials down to the atomic scale. Antwerpen
toggle visibility
Aerosol synthesis of nanostructured, ultrafine fullerene particles”. Joutsensaari J, Ahonen PP, Tapper U, Kauppinen EI, Pauwels B, Amelinckx S, Van Tendeloo G, (1999)
toggle visibility
Li B (2012) Aharonov-Bohm effect in semiconductor quantum rings. Antwerpen
toggle visibility
Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
toggle visibility
The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations”. Fredrickx P, Wouters J, Schryvers D Archetype, London, page 137 (2003).
toggle visibility
Artificial atoms and molecules”. Partoens B, Peeters FM, Physicalia magazine 24, 29 (2002)
toggle visibility
Atomen tellen”. Van Aert S, Batenburg J, Van Tendeloo S, Nederlands tijdschrift voor natuurkunde (1991) 77, 292 (2011)
toggle visibility
Atomic scale characterization of supported and assembled nanoparticles”. Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Verschoren G, Lievens P, Hou M, van Swygenhoven H, , B8.3 (2001)
toggle visibility
Atomic scale modeling of supported and assembled nanoparticles”. Zhurkin E, Hou M, van Swygenhoven H, Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Lievens P, Verschoren G, Kuriplach J, van Peteghem S, Segers D, Dauwe C, , B8.2 (2001)
toggle visibility
Yusupov M (2014) Atomic scale simulations for a better insight in plasma medicine. Antwerpen
toggle visibility
Komendová, L (2013) Characteristic length scales and vortex interactions in two-component superconducting systems. Antwerpen
toggle visibility
d' Hondt H (2011) Characterization of anion deficient perovskites. Antwerpen
toggle visibility
Kirilenko D (2012) Characterization of graphene by electron diffraction. Antwerpen
toggle visibility
Wiktor C (2014) Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy. Antwerpen
toggle visibility
Leroux F (2012) Characterization of soft-hard matter composite materials by advanced transmission electron microscopy. Universiteit Antwerpen, EMAT, Antwerpen
toggle visibility
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
toggle visibility
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: