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Thermally induced structural and morphological changes of CdSe/CdS octapods”. Goris B, van Huis MA, Bals S, Zandbergen HW, Manna L, Van Tendeloo G, Small 8, 937 (2012). http://doi.org/10.1002/smll.201101897
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Using self-driven microswimmers for particle separation”. Yang W, Misko VR, Nelissen K, Kong M, Peeters FM, Soft matter 8, 5175 (2012). http://doi.org/10.1039/c2sm07382j
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Optimizing Er/Yb ratio and content in Er-Yb co-doped glass-ceramics for enhancement of the up- and down-conversion luminescence”. Tikhomirov VK, Rodríguez VD, Méndez-Ramos J, del- Castillo J, Kirilenko D, Van Tendeloo G, Moshchalkov VV, Solar energy materials and solar cells 100, 209 (2012). http://doi.org/10.1016/j.solmat.2012.01.019
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The future of organic photovoltaic solar cells as a direct power source for consumer electronics”. Lizin S, Van Passel S, De Schepper E, Vranken L, Solar Energy Materials And Solar Cells 103, 1 (2012). http://doi.org/10.1016/J.SOLMAT.2012.04.001
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Bi0.75Sr0.25FeO3-\delta : revealing order/disorder phenomena by combining diffraction techniques”. Pachoud E, Bréard Y, Martin C, Maignan A, Abakumov AM, Suard E, Smith RI, Suchomel MR, Solid state communications 152, 331 (2012). http://doi.org/10.1016/j.ssc.2011.12.023
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Modeling the impact of junction angles in tunnel field-effect transistors”. Kao K-H, Verhulst AS, Vandenberghe WG, Sorée B, Groeseneken G, De Meyer K, Solid state electronics 69, 31 (2012). http://doi.org/10.1016/j.sse.2011.10.032
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Quantum simulations of electrostatics in Si cylindrical junctionless nanowire nFETs and pFETs with a homogeneous channel including strain and arbitrary crystallographic orientations”. Pham A-T, Sorée B, Magnus W, Jungemann C, Meinerzhagen B, Pourtois G, Solid state electronics 71, 30 (2012). http://doi.org/10.1016/j.sse.2011.10.016
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Optimization of operating parameters for inductively coupled plasma mass spectrometry : a computational study”. Aghaei M, Lindner H, Bogaerts A, Spectrochimica acta: part B : atomic spectroscopy 76, 56 (2012). http://doi.org/10.1016/j.sab.2012.06.006
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Multiscale characterization of the work hardening mechanisms in Fe-Mn based TWIP steels”. Renard K, Idrissi H, Schryvers D, Jacques PJ, Steel research international 83, 385 (2012). http://doi.org/10.1002/srin.201100312
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The Cooper problem in nanoscale : enhancement of the coupling due to confinement”. Croitoru MD, Vagov A, Shanenko AA, Axt VM, Superconductor science and technology 25, 124001 (2012). http://doi.org/10.1088/0953-2048/25/12/124001
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Chemical boundary conditions for the classification of aerosol particles using computer controlled electron probe microanalysis”. Anaf W, Horemans B, Van Grieken R, De Wael K, Talanta : the international journal of pure and applied analytical chemistry 101, 420 (2012). http://doi.org/10.1016/J.TALANTA.2012.09.051
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Ruthenocene and cyclopentadienyl pyrrolyl ruthenium as precursors for ruthenium atomic layer deposition : a comparative study of dissociation enthalpies”. Phung QM, Vancoillie S, Delabie A, Pourtois G, Pierloot K, Theoretical chemistry accounts : theory, computation, and modeling 131, 1238 (2012). http://doi.org/10.1007/s00214-012-1238-3
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Direct structure inversion from exit waves : part 2 : a practical example”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 116, 77 (2012). http://doi.org/10.1016/j.ultramic.2012.03.011
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Electron tomography based on a total variation minimization reconstruction technique”. Goris B, van den Broek W, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 113, 120 (2012). http://doi.org/10.1016/j.ultramic.2011.11.004
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Improved multislice calculations for including higher-order Laue zones effects”. Lobato I, van Dyck D, Ultramicroscopy 119, 63 (2012). http://doi.org/10.1016/j.ultramic.2012.01.003
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A new way of producing electron vortex probes for STEM”. Verbeeck J, Tian H, Béché, A, Ultramicroscopy 113, 83 (2012). http://doi.org/10.1016/j.ultramic.2011.10.008
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Oxidation state and chemical shift investigation in transition metal oxides by EELS”. Tan H, Verbeeck J, Abakumov A, Van Tendeloo G, Ultramicroscopy 116, 24 (2012). http://doi.org/10.1016/j.ultramic.2012.03.002
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Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits?”.Wang A, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 114, 20 (2012). http://doi.org/10.1016/j.ultramic.2011.12.002
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Sub-nanometer free electrons with topological charge”. Schattschneider P, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Hell J, Verbeeck J, Ultramicroscopy 115, 21 (2012). http://doi.org/10.1016/j.ultramic.2012.01.010
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Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11)”. Klingstedt M, Sundberg M, Eriksson L, Haigh S, Kirkland A, Grüner D, de Backer A, Van Aert S, Tarasaki O, Zeitschrift für Kristallographie 227, 341 (2012). http://doi.org/10.1524/zkri.2012.1517
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