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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
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Influence of sample thickness, excitation energy and geometry on particle size effects in XRF”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 14, 183 (1985). http://doi.org/10.1002/XRS.1300140409
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Introducing four new members of the editorial board of X-ray spectrometry”. Van Grieken R, X-ray spectrometry 44, 1 (2015). http://doi.org/10.1002/XRS.2577
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Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 67 (2014). http://doi.org/10.1002/XRS.2534
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Investigation of heavy metal distributions along 15m soil profiles using EDXRF, XRD, SEM-EDX, and ICP-MS techniques”. Ozen SA, Ozkalayci F, Cevik U, Van Grieken R, X-ray spectrometry 47, 231 (2018). http://doi.org/10.1002/XRS.2832
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Literature trends in x-ray emission spectrometry in the period 1990-2000: a review”. Injuk J, Van Grieken R, X-ray spectrometry 32, 35 (2003). http://doi.org/10.1002/XRS.606
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Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra”. Van Dyck P, Török S, Van Grieken R, X-ray spectrometry 15, 231 (1986). http://doi.org/10.1002/XRS.1300150403
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New Chinese members of the Advisory Board of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 35, 205 (2006)
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New insights in technology characterization of medieval Valencia glazes”. Romero-Pastor J, Garcia-Porras A, Van Grieken R, Potgieter-Vermaak S, Coll-Conesa J, Cardell C, X-ray spectrometry 44, 426 (2015). http://doi.org/10.1002/XRS.2613
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New members of the editorial board of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 42, 1 (2013). http://doi.org/10.1002/XRS.2431
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Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles”. Szalóki I, Osán J, Worobiec A, de Hoog J, Van Grieken R, X-ray spectrometry 30, 143 (2001). http://doi.org/10.1002/XRS.473.ABS
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Optimized energy dispersive X-ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites”. Arana A, Loureiro AL, Barbosa HMJ, Van Grieken R, Artaxo P, X-ray spectrometry 43, 228 (2014). http://doi.org/10.1002/XRS.2544
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Progress in laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, X-ray spectrometry 28, 224 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
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Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
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Speciation of selected metals in aerosol samples by TXRF after sequential leaching”. Samek L, Ostachowicz B, Worobiec A, Spolnik Z, Van Grieken R, X-ray spectrometry 35, 226 (2006). http://doi.org/10.1002/XRS.905
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 18, 259 (1989). http://doi.org/10.1002/XRS.1300180604
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Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence”. Sauter L, Van der Ben D, Van Grieken R, X-ray spectrometry 8, 159 (1979). http://doi.org/10.1002/XRS.1300080405
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Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 19, 141 (1990). http://doi.org/10.1002/XRS.1300190311
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EXRS2022 : the 2022 edition of the European X-ray Spectrometry conference, held in Bruges, Belgium”. Janssens K, X-ray spectrometry 52, 276 (2023). http://doi.org/10.1002/XRS.3386
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Automated segmentation of μ-XRF image sets”. Vekemans B, Janssens K, Vincze L, Aerts A, Adams F, Hertogen J, X-ray spectrometry 26, 333 (1997)
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries”. van der Linden V, Schalm O, Houbraken J, Thomas M, Meesdom E, Devos A, van Dooren R, Nieuwdorp H, Janssen E, Janssens K, X-ray spectrometry 39, 112 (2010). http://doi.org/10.1002/XRS.1207
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
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ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, X-ray spectrometry 30, 242 (2001). http://doi.org/10.1002/XRS.494.ABS
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