| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Wang, J.; Nguyen, M.D.; Gauquelin, N.; Verbeeck, J.; Do, M.T.; Koster, G.; Rijnders, G.; Houwman, E. |
On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors |
2020 |
Physica Status Solidi-Rapid Research Letters |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
| Chen, B.; Gauquelin, N.; Reith, P.; Halisdemir, U.; Jannis, D.; Spreitzer, M.; Huijben, M.; Abel, S.; Fompeyrine, J.; Verbeeck, J.; Hilgenkamp, H.; Rijnders, G.; Koster, G. |
Thermal-strain-engineered ferromagnetism of LaMnO3/SrTiO3 heterostructures grown on silicon |
2020 |
Physical review materials |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
| Araizi-Kanoutas, G.; Geessinck, J.; Gauquelin, N.; Smit, S.; Verbeek, X.H.; Mishra, S.K.; Bencok, P.; Schlueter, C.; Lee, T.-L.; Krishnan, D.; Fatermans, J.; Verbeeck, J.; Rijnders, G.; Koster, G.; Golden, M.S. |
Co valence transformation in isopolar LaCoO3/LaTiO3 perovskite heterostructures via interfacial engineering |
2020 |
Physical review materials |
4 |
13 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Van Tendeloo, G.; Rijnders, G.; Blank, D.H.A.; Leca, V.; Salluzzo, M. |
Optimisation of superconducting thin films by TEM |
2002 |
Physica: C : superconductivity |
372/376 |
6 |
UA library record; WoS full record; WoS citing articles |
| Koster, G.; Verbist, K.; Rijnders, G.; Rogalla, H.; Van Tendeloo, G.; Blank, D.H.A. |
Structure and properties of (Sr,Ca)CuO2-BaCuO2 superlattices grown by pulsed laser interval deposition |
2001 |
Physica: C : superconductivity |
353 |
8 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Rijnders, G.; Blank, D.H.A.; Van Tendeloo, G. |
TEM of ultra-thin DyBa2Cu3O7-x films deposited on TiO2 terminated SrTiO3 |
2001 |
Physica: C : superconductivity |
355 |
26 |
UA library record; WoS full record; WoS citing articles |
| Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |
