| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
| Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry |
2001 |
Langmuir |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
| Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
