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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Celentano, G.; Rizzo, F.; Augieri, A.; Mancini, A.; Pinto, V.; Rufoloni, A.; Vannozzi, A.; MacManus-Driscoll, J.L.; Feighan, J.; Kursumovic, A.; Meledin, A.; Mayer, J.; Van Tendeloo, G. |
YBa2Cu3O7−xfilms with Ba2Y(Nb,Ta)O6nanoinclusions for high-field applications |
2020 |
Superconductor Science & Technology |
33 |
|
UA library record; WoS full record; WoS citing articles |
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Epurescu, G.; Dinescu, G.; Moldovan, A.; Birjega, R.; Dipietrantonio, F.; Verona, E.; Verardi, P.; Nistor, L.C.; Ghica, C.; Van Tendeloo, G.; Dinescu, A. |
P-type ZnO thin films grown by RF plasma beam assisted Pulsed Laser Deposition |
2007 |
Superlattices and microstructures |
42 |
19 |
UA library record; WoS full record; WoS citing articles |
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Ye, M.; Schroeder, J.; Deltour, R.; Delplancke, M.P.; Winand, R.; Verbist, K.; Van Tendeloo, G. |
Structural properties of c-axis oriented epitaxial YBa2Cu3O7-\delta thin films |
1997 |
Superlattices and microstructures |
21 |
|
UA library record; WoS full record; |
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Mahieu, S.; Ghekiere, P.; de Winter, G.; de Gryse, R.; Depla, D.; Van Tendeloo, G.; Lebedev, O.I. |
Biaxially aligned titanium nitride thin films deposited by reactive unbalanced magnetron sputtering |
2006 |
Surface and coatings technology |
200 |
36 |
UA library record; WoS full record; WoS citing articles |
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Major, L.; Morgiel, J.; Major, B.; Lackner, J.M.; Waldhauser, W.; Ebner, R.; Nistor, L.; Van Tendeloo, G. |
Crystallographic aspects related to advanced tribological multilayers of Cr/CrN and Ti/TiN types produced by pulsed laser deposition (PLD) |
2006 |
Surface and coatings technology |
200 |
32 |
UA library record; WoS full record; WoS citing articles |
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Major, L.; Tirry, W.; Van Tendeloo, G. |
Microstructure and defect characterization at interfaces in TiN/CrN multilayer coatings |
2008 |
Surface and coatings technology |
202 |
23 |
UA library record; WoS full record; WoS citing articles |
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Huq, M.Z.; Celis, J.P.; Meneve, J.; Stals, L.; Schryvers, D. |
Oscillating sliding wear of mono- and multilayer ceramic coatings in air |
1999 |
Surface and coatings technology |
113 |
10 |
UA library record; WoS full record; WoS citing articles |
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Lamas, J.S.; Leroy, W.P.; Lu, Y.-G.; Verbeeck, J.; Van Tendeloo, G.; Depla, D. |
Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films |
2014 |
Surface and coatings technology |
238 |
8 |
UA library record; WoS full record; WoS citing articles |
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Cremers, V.; Rampelberg, G.; Barhoum, A.; Walters, P.; Claes, N.; Oliveira, T.M. de; Assche, G.V.; Bals, S.; Dendooven, J.; Detavernier, C. |
Oxidation barrier of Cu and Fe powder by Atomic Layer Deposition |
2018 |
Surface and coatings technology |
349 |
10 |
UA library record; WoS full record; WoS citing articles |
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Sharp, J.; Mueller, I.C.; Mandal, P.; Abbas, A.; Nord, M.; Doye, A.; Ehiasarian, A.; Hovsepian, P.; MacLaren, I.; Rainforth, W.M. |
Characterisation of a high-power impulse magnetron sputtered C/Mo/W wear resistant coating by transmission electron microscopy |
2019 |
Surface and coatings technology |
377 |
1 |
UA library record; WoS full record; WoS citing articles |
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Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. |
Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example |
1999 |
Surface and interface analysis |
27 |
4 |
UA library record; WoS full record; WoS citing articles |
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Aichele, T.; Robin, I.-C.; Bougerol, C.; André, R.; Tatarenko, S.; Van Tendeloo, G. |
CdSe quantum dot formation induced by amorphous Se |
2007 |
Surface science : a journal devoted to the physics and chemistry of interfaces
T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE |
601 |
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UA library record; WoS full record |
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Zhang, X.B.; Vasiliev, A.L.; Van Tendeloo, G.; He, Y.; Yu, L.-M.; Thiry, P.A. |
EM, XPS and LEED study of deposition of Ag on hydrogenated Si substrate prepared by wet chemical treatments |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
340 |
11 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. |
Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
337 |
10 |
UA library record; WoS full record; WoS citing articles |
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Bittencourt, C.; Felten, A.; Douhard, B.; Colomer, J.-F.; Van Tendeloo, G.; Drube, W.; Ghijsen, J.; Pireaux, J.-J. |
Metallic nanoparticles on plasma treated carbon nanotubes : $Nano2hybrids$ |
2007 |
Surface science : a journal devoted to the physics and chemistry of interfaces
T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE |
601 |
44 |
UA library record; WoS full record; WoS citing articles |
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Quintelier, M.; Perkisas, T.; Poppe, R.; Batuk, M.; Hendrickx, M.; Hadermann, J. |
Determination of spinel content in cycled Li1.2Ni0.13Mn0.54Co0.13O2 using three-dimensional electron diffraction and precession electron diffraction |
2021 |
Symmetry-Basel |
13 |
|
UA library record; WoS full record |
|
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Kirilenko, D.A. |
Electron diffraction measurement of the binding rigidity of free-standing graphene |
2013 |
Technical physics letters |
39 |
3 |
UA library record; WoS full record; WoS citing articles |
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Bai, J.; Wang, J.T.-W.; Rubio, N.; Protti, A.; Heidari, H.; Elgogary, R.; Southern, P.; Al-Jamal, W.' T.; Sosabowski, J.; Shah, A.M.; Bals, S.; Pankhurst, Q.A.; Al-Jamal, K.T. |
Triple-Modal Imaging of Magnetically-Targeted Nanocapsules in Solid TumoursIn Vivo |
2016 |
Theranostics |
6 |
54 |
UA library record; WoS full record; WoS citing articles |
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Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
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E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; |
Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment |
2014 |
Thin solid films : an international journal on the science and technology of thin and thick films |
|
7 |
UA library record; WoS full record; WoS citing articles |
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Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. |
Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
583 |
5 |
UA library record; WoS full record; WoS citing articles |
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Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. |
Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering |
2006 |
Thin solid films : an international journal on the science and technology of thin and thick films |
500 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. |
The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films |
2011 |
Thin solid films : an international journal on the science and technology of thin and thick films |
519 |
4 |
UA library record; WoS full record; WoS citing articles |
|
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Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. |
Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering |
2005 |
Thin solid films : an international journal on the science and technology of thin and thick films |
484 |
23 |
UA library record; WoS full record; WoS citing articles |
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Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. |
Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing |
2007 |
Thin solid films : an international journal on the science and technology of thin and thick films |
515 |
86 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D.; Yandouzi, M.; Toth, L. |
TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film |
1998 |
Thin solid films : an international journal on the science and technology of thin and thick films |
326 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Samani, M.K.; Ding, X.Z.; Khosravian, N.; Amin-Ahmadi, B.; Yi, Y.; Chen, G.; Neyts, E.C.; Bogaerts, A.; Tay, B.K. |
Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
578 |
41 |
UA library record; WoS full record; WoS citing articles |
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Forsh, E.A.; Abakumov, A.M.; Zaytsev, V.B.; Konstantinova, E.A.; Forsh, P.A.; Rumyantseva, M.N.; Gaskov, A.M.; Kashkarov, P.K. |
Optical and photoelectrical properties of nanocrystalline indium oxide with small grains |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
595 |
18 |
UA library record; WoS full record; WoS citing articles |
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Chizhov, A.S.; Rumyantseva, M.N.; Vasiliev, R.B.; Filatova, D.G.; Drozdov, K.A.; Krylov, I.V.; Marchevsky, A.V.; Karakulina, O.M.; Abakumov, A.M.; Gaskov, A.M. |
Visible light activation of room temperature NO2 gas sensors based on ZnO, SnO2 and In2O3 sensitized with CdSe quantum dots |
2016 |
Thin solid films : an international journal on the science and technology of thin and thick films |
618 |
19 |
UA library record; WoS full record; WoS citing articles |
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Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D. |
Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy |
2020 |
Thin solid films : an international journal on the science and technology of thin and thick films |
707 |
|
UA library record; WoS full record; WoS citing articles |
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