Number of records found: 334
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Citations
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Quantum wavefront shaping with a 48-element programmable phase plate for electrons”. Yu CP, Vega Ibañez F, Béché, A, Verbeeck J, SciPost Physics 15, 223 (2023). http://doi.org/10.21468/SciPostPhys.15.6.223
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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Well shaped Mn3O4 nano-octahedra with anomalous magnetic behavior and enhanced photodecomposition properties”. Li Y, Tan H, Yang X-Y, Goris B, Verbeeck J, Bals S, Colson P, Cloots R, Van Tendeloo G, Su B-L, Small 7, 475 (2011). http://doi.org/10.1002/smll.201001403
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X-ray and electron spectroscopy investigation of the coreshell nanowires of ZnO:Mn”. Guda AA, Smolentsev N, Verbeeck J, Kaidashev EM, Zubavichus Y, Kravtsova AN, Polozhentsev OE, Soldatov AV, Solid state communications 151, 1314 (2011). http://doi.org/10.1016/j.ssc.2011.06.028
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Energy-filtered transmission electron microscopy: an overview”. Verbeeck J, van Dyck D, Van Tendeloo G, Spectrochimica acta: part B : atomic spectroscopy 59, 1529 (2004). http://doi.org/10.1016/j.sab.2004.03.020
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Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors”. Molina L, Tan H, Biermans E, Batenburg KJ, Verbeeck J, Bals S, Van Tendeloo G, Superconductor science and technology 24, 065019 (2011). http://doi.org/10.1088/0953-2048/24/6/065019
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Interlayer structure in YBCO-coated conductors prepared by chemical solution deposition”. Molina L, Egoavil R, Turner S, Thersleff T, Verbeeck J, Holzapfel B, Eibl O, Van Tendeloo G, Superconductor science and technology 26, 075016 (2013). http://doi.org/10.1088/0953-2048/26/7/075016
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Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films”. Lamas JS, Leroy WP, Lu Y-G, Verbeeck J, Van Tendeloo G, Depla D, Surface and coatings technology 238, 45 (2014). http://doi.org/10.1016/j.surfcoat.2013.10.034
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Non-invasive and non-destructive examination of artistic pigments, paints, and paintings by means of X-Ray methods”. Janssens K, van der Snickt G, Vanmeert F, Legrand S, Nuyts G, Alfeld M, Monico L, Anaf W, de Nolf W, Vermeulen M, Verbeeck J, De Wael K, Topics in Current Chemistry 374, 81 (2016). http://doi.org/10.1007/S41061-016-0079-2
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Accuracy and precision in model based EELS quantification”. Bertoni G, Verbeeck J, Ultramicroscopy 108, 782 (2008). http://doi.org/10.1016/j.ultramic.2008.01.004
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Atomic resolution mapping of phonon excitations in STEM-EELS experiments”. Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J, Ultramicroscopy 147, 1 (2014). http://doi.org/10.1016/j.ultramic.2014.04.011
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Deconvolution of core electron energy loss spectra”. Verbeeck J, Bertoni G, Ultramicroscopy 109, 1343 (2009). http://doi.org/10.1016/j.ultramic.2009.06.010
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Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25”. Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H, Ultramicroscopy 110, 881 (2010). http://doi.org/10.1016/j.ultramic.2010.03.012
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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Electron inelastic, scattering and anisotropy: the two-dimensional point of view”. Radtke G, Botton GA, Verbeeck J, Ultramicroscopy 106, 1082 (2006). http://doi.org/10.1016/j.ultramic.2006.04.023
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Experiments on inelastic electron holography”. Potapov P, Lichte H, Verbeeck J, van Dyck D, Ultramicroscopy 106, 1012 (2006). http://doi.org/10.1016/j.ultramic.2006.05.012
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Exploring different inelastic projection mechanisms for electron tomography”. Goris B, Bals S, van den Broek W, Verbeeck J, Van Tendeloo G, Ultramicroscopy 111, 1262 (2011). http://doi.org/10.1016/j.ultramic.2011.02.007
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A holographic biprism as a perfect energy filter?”.Verbeeck J, Bertoni G, Lichte H, Ultramicroscopy 111, 887 (2011). http://doi.org/10.1016/j.ultramic.2011.01.042
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Homogeneity and composition of AlInGaN : a multiprobe nanostructure study”. Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A, Ultramicroscopy 156, 29 (2015). http://doi.org/10.1016/j.ultramic.2015.04.012
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Image simulation of high resolution energy filtered TEM images”. Verbeeck J, Sc hattschneider P, Rosenauer A, Ultramicroscopy 109, 350 (2009). http://doi.org/10.1016/j.ultramic.2009.01.003
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Inelastic electron holography as a variant of the Feynman thought experiment”. Potapov PL, Verbeeck J, Schattschneider P, Lichte H, van Dyck D, Ultramicroscopy 107, 559 (2007). http://doi.org/10.1016/j.ultramic.2006.11.003
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Interpretation of “Energy-filtered electron-diffracted beam holography&rdquo, by R.A. Herring”. Verbeeck J, Ultramicroscopy 106, 461 (2006). http://doi.org/10.1016/j.ultramic.2005.12.004
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Is magnetic chiral dichroism feasible with electron vortices?”.Schattschneider P, Löffler S, Stöger-Pollach M, Verbeeck J, Ultramicroscopy 136, 81 (2014). http://doi.org/10.1016/j.ultramic.2013.07.012
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Model based quantification of EELS spectra”. Verbeeck J, Van Aert S, Ultramicroscopy 101, 207 (2004). http://doi.org/10.1016/j.ultramic.2004.06.004
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Model-based quantification of EELS spectra: including the fine structure”. Verbeeck J, Van Aert S, Bertoni G, Ultramicroscopy 106, 976 (2006). http://doi.org/10.1016/j.ultramic.2006.05.006
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Model-based quantification of EELS spectra: treating the effect of correlated noise”. Verbeeck J, Bertoni G, Ultramicroscopy 108, 74 (2008). http://doi.org/10.1016/j.ultramic.2007.03.004
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A new way of producing electron vortex probes for STEM”. Verbeeck J, Tian H, Béché, A, Ultramicroscopy 113, 83 (2012). http://doi.org/10.1016/j.ultramic.2011.10.008
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