| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. |
Exploring possibilities of band gap measurement with off-axis EELS in TEM |
2018 |
Ultramicroscopy |
189 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Sahin, H.; Leenaerts, O.; Singh, S.K.; Peeters, F.M. |
Graphane |
2015 |
Wiley Interdisciplinary Reviews: Computational Molecular Science |
5 |
54 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Sahin, H.; Torun, E.; Bacaksiz, C.; Horzum, S.; Kang, J.; Senger, R.T.; Peeters, F.M. |
Computing optical properties of ultra-thin crystals |
2016 |
Wiley Interdisciplinary Reviews: Computational Molecular Science |
6 |
14 |
UA library record; WoS full record; WoS citing articles |
|
