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Quantum transport in a cylindrical sub-0.1 μm silicon-based MOSFET”. Balaban SN, Pokatilov EP, Fomin VM, Gladilin VN, Devreese JT, Magnus W, Schoenmaker W, van Rossum M, Sorée B, Solid-State Electronics 46, 435 (2002). http://doi.org/10.1016/S0038-1101(01)00117-4
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Synthesis and investigation of novel Mn-based oxyfluoride Sr2Mn2O5-xF1+x”. Lobanov MV, Abakumov AM, Sidorova AV, Rozova MG, D'yachenko OG, Antipov EV, Hadermann J, Van Tendeloo G, Solid state sciences 4, 19 (2002). http://doi.org/10.1016/S1293-2558(01)01209-2
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Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry”. Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K, Spectrochimica acta: part B : atomic spectroscopy 57, 109 (2002). http://doi.org/10.1016/S0584-8547(01)00357-3
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Gas discharge plasmas and their applications”. Bogaerts A, Neyts E, Gijbels R, van der Mullen J, Spectrochimica acta: part B : atomic spectroscopy 57, 609 (2002). http://doi.org/10.1016/S0584-8547(01)00406-2
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Hybrid model for a cylindrical hollow cathode glow discharge and comparison with experiments”. Baguer N, Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 57, 311 (2002). http://doi.org/10.1016/S0584-8547(01)00385-8
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Hybrid Monte-Carlo-fluid modeling network for an argon/hydrogen direct current glow discharge”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 57, 1071 (2002). http://doi.org/10.1016/S0584-8547(02)00047-2
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Optimal experimental design of STEM measurement of atom column positions”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A, Ultramicroscopy 90, 273 (2002). http://doi.org/10.1016/S0304-3991(01)00152-8
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Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids”. Ignatova VA, van Vaeck L, Gijbels R, Adams F, Vacuum 69, 307 (2002). http://doi.org/10.1016/S0042-207X(02)00350-0
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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