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Effects of fluorination on the structure and superconducting properties of Y2Ba4Cu7O14+ phases”. Abakumov A, Rozova M, Shpanchenko R, Kovba M, Putilin S, Antipov E, Lebedev O, Van Tendeloo G, Kopnin E, Karpinski J, Physica: C : superconductivity 301, 155 (1998). http://doi.org/10.1016/S0921-4534(98)00108-7
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Effects of intersubband interaction on multisubband electron transport in single and double quantum wells”. Hai GQ, Studart N, Marques GE, Peeters FM, Koenraad PM, Physica. E: Low-dimensional systems and nanostructures 2, 222 (1998). http://doi.org/10.1016/S1386-9477(98)00048-4
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Electrical transport through magnetic barriers”. Ibrahim IS, Schweigert VA, Peeters FM, Physica. E: Low-dimensional systems and nanostructures 2, 899 (1998). http://doi.org/10.1016/S1386-9477(98)00183-0
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Mini-gaps and novel giant negative magnetoresistance in InAs/GaSb semimetallic superlattice”. Lakrimi M, Khym S, Symons DM, Nicholas RJ, Peeters FM, Mason NJ, Walker PJ, Physica. E: Low-dimensional systems and nanostructures 2, 363 (1998). http://doi.org/10.1016/S1386-9477(98)00076-9
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Resonant magnetopolaron effect in GaAs/AlGaAs multiple quantum well structures”. Wang YJ, Nichel HA, McCombe BD, Peeters FM, Shi JM, Hai GQ, Wu XG, Eustis TJ, Schaff W, Physica. E: Low-dimensional systems and nanostructures 2, 161 (1998). http://doi.org/10.1016/S1386-9477(98)00035-6
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Theory of the band mixing induced negative magnetoresistance in broken gap superlattices”. Symons DM, Peeters FM, Lakrimi M, Khym S, Portal JC, Mason NJ, Nicholas RJ, Walker PJ, Physica. E: Low-dimensional systems and nanostructures 2, 353 (1998). http://doi.org/10.1016/S1386-9477(98)00074-5
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Comprehensive three-dimensional modeling network for a dc glow discharge plasma”. Bogaerts A, Gijbels R, Plasma physics reports 24, 573 (1998)
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Interpretation of cappilary generated spatial and angular distribution of X-rays: theoretical modeling and experimental verification using the European Synchrotron Radiation Facility Optical Beamline”. Vincze L, Janssens K, Adams F, Engström P, Rindby A, The review of scientific instruments 69, 3494 (1998). http://doi.org/10.1063/1.1149127
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Collisional-radiative model for the sputtered copper atoms and ions in a direct current argon glow discharge”. Bogaerts A, Gijbels R, Carman RJ, Spectrochimica acta: part B : atomic spectroscopy 53, 1679 (1998). http://doi.org/10.1016/S0584-8547(98)00201-8
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Comprehensive description of a Grimm-type glow discharge source used for optical emission spectrometry: a mathematical simulation”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 53, 437 (1998). http://doi.org/10.1016/S0584-8547(97)00148-1
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Fundamental aspects and applications of glow discharge spectrometric techniques”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 53, 1 (1998). http://doi.org/10.1016/S0584-8547(97)00122-5
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Modeling of glow discharge optical emission spectrometry: calculation of the argon atomic optical emission spectrum”. Bogaerts A, Gijbels R, Vlcek J, Spectrochimica acta: part B : atomic spectroscopy 53, 1517 (1998). http://doi.org/10.1016/S0584-8547(98)00139-6
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Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties”. Verbist K, Lebedev OI, Verhoeven MAJ, Winchern R, Rijnders AJHM, Blank DHA, Tafuri F, Bender H, Van Tendeloo G, Superconductor science and technology 11, 13 (1998). http://doi.org/10.1088/0953-2048/11/1/004
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DX-center and pressure effects on electronic structure of a δ-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, Superlattices and microstructures 23, 83 (1998). http://doi.org/10.1006/spmi.1996.0327
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Precision magnetometry on a submicron scale: magnetisation of superconducting quantum dots”. Geim AK, Grigorieva IV, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, Superlattices and microstructures 23, 151 (1998). http://doi.org/10.1006/spmi.1996.0199
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TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film”. Schryvers D, Yandouzi M, Toth L, Thin solid films : an international journal on the science and technology of thin and thick films 326, 126 (1998). http://doi.org/10.1016/S0040-6090(98)00545-8
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