| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of glow discharges: what can we learn from it? |
1997 |
Analytical chemistry A-pages |
69 |
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of radio-frequency and direct current glow discharges in argon |
2000 |
Journal of technical physics |
41 |
|
UA library record |
|
|
Herrebout, D.; Bogaerts, A.; Gijbels, R. |
Modelleren van plasmas gebruikt voor de afzetting van dunne lagen |
2004 |
Chemie magazine |
|
|
UA library record |
|
|
Madani, M.; Bogaerts, A.; Gijbels, R.; Vangeneugden, D. |
Modelling of a dielectric barrier glow discharge at atmospheric pressure in nitrogen |
2002 |
|
|
|
UA library record |
|
|
de Bleecker, K.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Modelling of formation and transport of nanoparticles in silane discharges |
2004 |
|
|
|
UA library record |
|
|
Berezhnoi, S.; Kaganovich, I.; Bogaerts, A.; Gijbels, R. |
Modelling of radio frequency capacitively coupled plasma at intermediate pressures |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
|
|
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
|
|
Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten |
2004 |
Chemie magazine |
|
|
UA library record |
|
|
Madani, M.; Bogaerts, A.; Gijbels, R.; Vangeneugden, D. |
Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen |
2004 |
|
|
|
UA library record |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
|
|
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
|
|
UA library record |
|
|
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
|
|
|
UA library record |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
|
|
|
UA library record |
|
|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
|
|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
|
|
Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
|
|
UA library record |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
|
|
|
UA library record |
|
|
Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
|
|
|
UA library record; WoS full record; |
|
|
Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
|
|
|
UA library record |
|
|
de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
|
|
|
UA library record |
