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“Structures and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S, Muto S, Verheijen MA, van Loosdrecht PHM, Meijer G, Ultramicroscopy 51, 168 (1993). http://doi.org/10.1016/0304-3991(93)90145-N
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.436
Times cited: 17
DOI: 10.1016/0304-3991(93)90145-N
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“TEM sample preparation by FIB for carbon nanotube interconnects”. Ke X, Bals S, Romo Negreira A, Hantschel T, Bender H, Van Tendeloo G, Ultramicroscopy 109, 1353 (2009). http://doi.org/10.1016/j.ultramic.2009.06.011
Abstract: A powerful method to study carbon nanotubes (CNTs) grown in patterned substrates for potential interconnects applications is transmission electron microscopy (TEM). However, high-quality TEM samples are necessary for such a study. Here, TEM specimen preparation by focused ion beam (FIB) has been used to obtain lamellae of patterned samples containing CNTs grown inside contact holes. A dual-cap Pt protection layer and an extensive 5 kV cleaning procedure are applied in order to preserve the CNTs and avoid deterioration during milling. TEM results show that the inner shell structure of the carbon nanotubes has been preserved, which proves that focused ion beam is a useful technique to prepare TEM samples of CNT interconnects.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.843
Times cited: 21
DOI: 10.1016/j.ultramic.2009.06.011
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“Crystal structure and magnetic properties of novel reduced V(IV)-based oxide Pb2V5O12”. Shpanchenko RV, Chyornaya VV, Abakumov AM, Antipov EV, Hadermann J, Van Tendeloo G, Kaul E, Geibel C, Sheptyakov D, Balagurov AM, Zeitschrift für anorganische und allgemeine Chemie 627, 2143 (2001). http://doi.org/10.1002/1521-3749(200109)627:9<2143::AID-ZAAC2143>3.0.CO;2-R
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.144
Times cited: 4
DOI: 10.1002/1521-3749(200109)627:9<2143::AID-ZAAC2143>3.0.CO;2-R
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“Mg1-xRhB, a new boridometallide with 2D polyanion”. Alekseeva AM, Abakumov AM, Leithe-Jasper A, Schnelle W, Prots Y, Hadermann J, Van Tendeloo G, Antipov EV, Grin Y, Zeitschrift für anorganische und allgemeine Chemie 631, 1047 (2005). http://doi.org/10.1002/zaac.200400479
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.144
Times cited: 13
DOI: 10.1002/zaac.200400479
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“Ge40.0Te5.3I8: synthesis, crystal structure, and properties of a new clathrate-I compound”. Kovnir KA, Abramchuk NS, Zaikina JV, Baitinger M, Burkhardt U, Schnelle W, Olenev AV, Lebedev OI, Van Tendeloo G, Dikarev EV, Shevelkov AV, Zeitschrift für Kristallographie 221, 527 (2006). http://doi.org/10.1524/zkri.2006.221.5-7.527
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.179
Times cited: 16
DOI: 10.1524/zkri.2006.221.5-7.527
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“Phase transitions: an alternative for stress accommodation in CMR manganate films”. Lebedev OI, Van Tendeloo G, Zeitschrift für Metallkunde 95, 244 (2004). http://doi.org/10.3139/146.017943
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
DOI: 10.3139/146.017943
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