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Records |
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Author |
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
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Title |
Structures and phase transitions in C60 and C70 fullerites |
Type |
A1 Journal article |
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Year |
1993 |
Publication |
Ultramicroscopy |
Abbreviated Journal  |
Ultramicroscopy |
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Volume |
51 |
Issue |
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Pages |
168-188 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
A1993LN79100017 |
Publication Date |
2002-10-18 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0304-3991; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.436 |
Times cited |
17 |
Open Access |
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Notes |
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Approved |
PHYSICS, APPLIED 28/145 Q1 # |
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Call Number |
UA @ lucian @ c:irua:6836 |
Serial |
3319 |
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Author |
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
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Title |
TEM sample preparation by FIB for carbon nanotube interconnects |
Type |
A1 Journal article |
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Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
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Volume |
109 |
Issue |
11 |
Pages |
1353-1359 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
A powerful method to study carbon nanotubes (CNTs) grown in patterned substrates for potential interconnects applications is transmission electron microscopy (TEM). However, high-quality TEM samples are necessary for such a study. Here, TEM specimen preparation by focused ion beam (FIB) has been used to obtain lamellae of patterned samples containing CNTs grown inside contact holes. A dual-cap Pt protection layer and an extensive 5 kV cleaning procedure are applied in order to preserve the CNTs and avoid deterioration during milling. TEM results show that the inner shell structure of the carbon nanotubes has been preserved, which proves that focused ion beam is a useful technique to prepare TEM samples of CNT interconnects. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
000270765800006 |
Publication Date |
2009-07-11 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0304-3991; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.843 |
Times cited |
21 |
Open Access |
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Notes |
Esteem 026019; Iap |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
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Call Number |
UA @ lucian @ c:irua:79074 |
Serial |
3485 |
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Author |
Shpanchenko, R.V.; Chyornaya, V.V.; Abakumov, A.M.; Antipov, E.V.; Hadermann, J.; Van Tendeloo, G.; Kaul, E.; Geibel, C.; Sheptyakov, D.; Balagurov, A.M. |
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Title |
Crystal structure and magnetic properties of novel reduced V(IV)-based oxide Pb2V5O12 |
Type |
A1 Journal article |
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Year |
2001 |
Publication |
Zeitschrift für anorganische und allgemeine Chemie |
Abbreviated Journal |
Z Anorg Allg Chem |
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Volume |
627 |
Issue |
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Pages |
2143-2150 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Leipzig |
Editor |
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Language |
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Wos |
000171339000023 |
Publication Date |
2002-08-25 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0044-2313;1521-3749; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.144 |
Times cited |
4 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.144; 2001 IF: 1.165 |
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Call Number |
UA @ lucian @ c:irua:36048 |
Serial |
560 |
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Author |
Alekseeva, A.M.; Abakumov, A.M.; Leithe-Jasper, A.; Schnelle, W.; Prots, Y.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V.; Grin, Y. |
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Title |
Mg1-xRhB, a new boridometallide with 2D polyanion |
Type |
A1 Journal article |
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Year |
2005 |
Publication |
Zeitschrift für anorganische und allgemeine Chemie |
Abbreviated Journal |
Z Anorg Allg Chem |
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Volume |
631 |
Issue |
6/7 |
Pages |
1047-1054 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Leipzig |
Editor |
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Language |
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Wos |
000228931900010 |
Publication Date |
2005-04-18 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0044-2313;1521-3749; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.144 |
Times cited |
13 |
Open Access |
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Notes |
Iap V-1 |
Approved |
Most recent IF: 1.144; 2005 IF: 1.202 |
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Call Number |
UA @ lucian @ c:irua:52374 |
Serial |
3543 |
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Author |
Kovnir, K.A.; Abramchuk, N.S.; Zaikina, J.V.; Baitinger, M.; Burkhardt, U.; Schnelle, W.; Olenev, A.V.; Lebedev, O.I.; Van Tendeloo, G.; Dikarev, E.V.; Shevelkov, A.V. |
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Title |
Ge40.0Te5.3I8: synthesis, crystal structure, and properties of a new clathrate-I compound |
Type |
A1 Journal article |
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Year |
2006 |
Publication |
Zeitschrift für Kristallographie |
Abbreviated Journal |
Z Krist-Cryst Mater |
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Volume |
221 |
Issue |
5/7 |
Pages |
527-532 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
München |
Editor |
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Language |
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Wos |
000239321400026 |
Publication Date |
2006-07-07 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
2196-7105;2194-4946; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
3.179 |
Times cited |
16 |
Open Access |
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Notes |
Hprn-Ct |
Approved |
Most recent IF: 3.179; 2006 IF: NA |
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Call Number |
UA @ lucian @ c:irua:60122 |
Serial |
3534 |
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Author |
Lebedev, O.I.; Van Tendeloo, G. |
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Title |
Phase transitions: an alternative for stress accommodation in CMR manganate films |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Zeitschrift für Metallkunde |
Abbreviated Journal |
Z Metallkd |
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Volume |
95 |
Issue |
4 |
Pages |
244-246 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Stuttgart |
Editor |
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Language |
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Wos |
000221329500011 |
Publication Date |
2013-12-09 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0044-3093; |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:54864 |
Serial |
2593 |
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| Permanent link to this record |
