Number of records found: 1296
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Citations
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Modelleren van plasmas gebruikt voor de afzetting van dunne lagen”. Herrebout D, Bogaerts A, Gijbels R, Chemie magazine , 34 (2004)
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Modelling of a dielectric barrier glow discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 130 (2002)
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Modelling of formation and transport of nanoparticles in silane discharges”. de Bleecker K, Bogaerts A, Goedheer WJ, Gijbels R, , 0 (2004)
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Modelling of radio frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 525 (1999).
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Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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Autrique D (2014) Multiphase modelling of a ns-laser-irradiated copper sample. Antwerpen
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Nanoparticle growth and transport mechanisms in capacitively coupled silane discharges: a numerical investigation”. de Bleecker K, Bogaerts A, Goedheer WJ, , 201 (2005)
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Khalilov U (2013) New perspectives on thermal and hyperthermal oxidation of Si surfaces. Antwerpen
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Novel device concepts for nanotechnology : the nanowire pinch-off FET and graphene tunnelFET”. Sorée B, Magnus W, Szepieniec M, Vandenbreghe W, Verhulst A, Pourtois G, Groeseneken G, de Gendt S, Heyns M, ECS transactions 28, 15 (2010)
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Numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Vangeneugden D, , 53 (2005)
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Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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Tinck S (2011) Numerical simulations of inductively coupled plasmas for applications in the microelectronics industry. Antwerpen
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Numerical study on energy efficiency of a cylindrical dielectric barrier discharge plasma-chemical reactor”. Petrovic D, Martens T, De Bie C, van Dijk J, Brok WJM, Bogaerts A, , 109 (2009)
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On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum)”. Oleshko VP, Gijbels RH, van Daele AJ, Jacob WA, Nanostructered materials 11, 687 (1999)
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Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten”. Adriaensen L, Vangaever F, Gijbels R, Chemie magazine , 10 (2004)
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Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 49 (2004)
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PECVD growth of carbon nanotubes : from experiment to simulation”. Neyts EC, Journal of vacuum science and technology: B: micro-electronics processing and phenomena 30, 030803 (2012). http://doi.org/10.1116/1.3702806
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Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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Plasma chemistry modeling for an inductively coupled plasma used for the growth of carbon nanotubes”. Mao M, Bogaerts A, Journal of physics : conference series 275, 012021 (2011). http://doi.org/10.1088/1742-6596/275/1/012021
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Van Gaens W (2014) Plasma chemistry modelling of an atmospheric pressure argon plasma jet with air impurities for plasma medicine applications. Antwerpen
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Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1”. de Vyt A, Gijbels R, van Roost C, Geuens I, , 524 (1998)
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Reaction mechanisms and thin a-C:H film growth from low energy hydrocarbon radicals”. Neyts E, Bogaerts A, van de Sanden MCM, Journal of physics : conference series 86, 12020 (2007). http://doi.org/10.1088/1742-6596/86/1/012020
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Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques”. Oleshko VP, Gijbels RH, Jacob WA, , 657 (1998)
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Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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A self-consistent mathematical model of a hollow cathode glow discharge”. Baguer N, Bogaerts A, Gijbels R, , 157 (1999)
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification”. Gijbels R, Verlinden G, Geuens I London Institute of Physics, Bristol, page 331 (2000).
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