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“Magnetoexcitons in type-II self-assembled quantum dots and quantum-dot superlattices”. Veljkovic D, Tadić, M, Peeters FM, Recent developments in advanced materials and processes 518, 51 (2006)
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
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“Numerical modeling for a better understanding of gas discharge plasmas”. Bogaerts A, de Bleecker K, Georgieva V, Herrebout D, Kolev I, Madani M, Neyts E, High temperature material processes 9, 321 (2005). http://doi.org/10.1615/HighTempMatProc.v9.i3.10
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Times cited: 1
DOI: 10.1615/HighTempMatProc.v9.i3.10
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“Coulomb-interaction driven anomaly in the Stark effect for an exciton in vertically coupled quantum dots”. Chwiej T, Bednarek S, Adamowski J, Szafran B, Peeters FM, Journal of luminescence
T2 –, 6th International Conference on Excitonic Processes in Condensed Matter, (EXCON 04), JUL 06-09, 2004, Cracow, POLAND 112, 122 (2005). http://doi.org/10.1016/j.jlumin.2004.09.009
Abstract: The effect of the electric field on an exciton confined in a pair of vertically coupled quantum dots is studied. We use a single-band approximation and a parabolic model potential. As a result of these idealizations, we obtain a numerically solvable model, which is used to describe the influence of the electron-hole interaction on the Stark effect for the lowest-energy photo luminescence lines. We show that for intermediate tunnel coupling between the dots this interaction leads to an anomalous Stark effect with an essential deviation of the recombination energy from the usual quadratic dependence on the electric field. (c) 2004 Elsevier B.V. All rights reserved.
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 2.686
Times cited: 10
DOI: 10.1016/j.jlumin.2004.09.009
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“Patterns of damage in igneous and sedimentary rocks under conditions simulating sea-salt weathering”. Cardell C, Rivas T, Mosquera MJ, Birginie JM, Moropoulou A, Prieto B, Silva B, Van Grieken R, Earth surface processes and landforms 28, 1 (2003). http://doi.org/10.1002/ESP.408
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/ESP.408
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“Atomic structure of alloys close to phase transitions”. Van Tendeloo G, Schryvers D, Nucleation and growth processes in materials 580, 283 (2000)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Characterization of colloidal and particulate matter transported by the Magela Creek system, Northern Australia”. Hart BT, Douglas GB, Beckett R, van Put A, Van Grieken R, Hydrological processes 7, 105 (1993)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Recombination reactions and geometry effects in laser microprobe mass analysis studied with 12C/13C bilayers”. Bruynseels F, Van Grieken R, International journal of mass spectrometry and ion processes 74, 161 (1986). http://doi.org/10.1016/0168-1176(86)85003-0
Abstract: Bilayers of carbon, consisting of a layer of natural carbon and a second layer highly enriched in 13C, were investigated with the LAMMA 500-® instrument. When such a bilayer is perforated by the laser beam, comparable amounts of 12C and 13C are evaporated and partly ionized so that geometry effects and recombination reactions during laser-induced ionization can straightforwardly be studied.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0168-1176(86)85003-0
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“Influence of spark generator parameters in the analysis of graphite-electrodes by spark source-mass spectrometry”. Vos L, Van Grieken R, International journal of mass spectrometry and ion processes 55, 233 (1984). http://doi.org/10.1016/0168-1176(84)87087-1
Abstract: Spark source mass spectrometric analyses of doped carbon samples were performed at different pulse lengths, pulse frequencies and breakdown voltages. The pulse length and pulse frequencies had no influence on the analysis. The relation between breakdown voltage, spark gap and sample matrix was determined. With increasing breakdown voltage, the abundance of the multiply charged ions was found to decrease, whereas the abundance of the cluster ions increased. The breakdown voltage was also found to affect the absolute and relative intensities of different elements in different manners. Interpretation of these results led to some new considerations on the phenomena in a spark discharge.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0168-1176(84)87087-1
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“Influence of ion-source geometry in spark source-mass spectrometric analysis”. Vos L, Van Grieken R, International journal of mass spectrometry and ion processes 59, 221 (1984). http://doi.org/10.1016/0168-1176(84)85098-3
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0168-1176(84)85098-3
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“Influence of ion energy-distributions and matrix effects on spark source-mass spectrometric analysis”. Vos L, Van Grieken R, International journal of mass spectrometry and ion processes 51, 63 (1983). http://doi.org/10.1016/0020-7381(83)85029-3
Abstract: The energy distributions of ions produced in a spark source mass spectrometer were recorded for different trace element ions and for the total ion current. Both electrodes of pure doped graphite, and with 10% potassium salts added, were examined. The results show that the measured energy of an ion is mainly determined by the m/z ratio and that the energy of the total ion current depends on the sample composition. It was also clear that if the accelerating voltage is set to obtain maximum transmission of the total ion current, the fraction of the heavy elements that is discriminated at the β-slit depends on the matrix composition if the pass band of the instrument is narrow. These effects influence considerably the accuracy in the analysis of variable samples.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0020-7381(83)85029-3
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