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“Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique
T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.154
Times cited: 1
DOI: 10.1002/jemt.1070250216
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