NANOlab Center of Excellence literature database -- Query Results

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Citations

“Transmission electron microscopy of NdNiO₃ thin films on silicon substrates”. Laffez P, Retoux R, Boullay P, Zaghrioui M, Lacorre P, Van Tendeloo G, European physical journal: applied physics 12, 55 (2000). http://doi.org/10.1051/epjap:2000171 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 0.684 Times cited: 16 DOI: 10.1051/epjap:2000171 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=3711