NANOlab Center of Excellence literature database -- Query Results

“Real-space simulations of spin-polarized electronic transitions in iron”. Schattschneider P, Verbeeck J, Mauchamp V, Jaouen M, Hamon A-L, Physical review : B : condensed matter and materials physics 82, 144418 (2010). http://doi.org/10.1103/PhysRevB.82.144418 Abstract: After the advent of energy-loss magnetic chiral dichroism (EMCD) in 2006, rapid progress in theoretical understanding and in experimental performance was achieved, recently demonstrating a spatial resolution of better than 2 nm. Similar to the x-ray magnetic circular dichroism technique, EMCD is used to study atom specific magnetic moments. The latest generation of electron microscopes opens the road to the mapping of spin moments on the atomic scale with this method. Here the theoretical background to reach this challenging aim is elaborated. Numerical simulations of the L3 transition in an Fe specimen, based on a combination of the density-matrix approach for inelastic electron scattering with the propagation of the probe electron in the lattice potential indicate the feasibility of single spin mapping in the electron microscope. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 3.836 Times cited: 11 DOI: 10.1103/PhysRevB.82.144418 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=2832
“ELNES study of carbon K-edge spectra of plasma deposited carbon films”. Hamon A-L, Verbeeck J, Schryvers D, Benedikt J, van den Sanden RMCM, Journal of materials chemistry 14, 2030 (2004). http://doi.org/10.1039/b406468m Abstract: Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 6.626 Times cited: 61 DOI: 10.1039/b406468m Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=1025

Abstract: After the advent of energy-loss magnetic chiral dichroism (EMCD) in 2006, rapid progress in theoretical understanding and in experimental performance was achieved, recently demonstrating a spatial resolution of better than 2 nm. Similar to the x-ray magnetic circular dichroism technique, EMCD is used to study atom specific magnetic moments. The latest generation of electron microscopes opens the road to the mapping of spin moments on the atomic scale with this method. Here the theoretical background to reach this challenging aim is elaborated. Numerical simulations of the L3 transition in an Fe specimen, based on a combination of the density-matrix approach for inelastic electron scattering with the propagation of the probe electron in the lattice potential indicate the feasibility of single spin mapping in the electron microscope.

Abstract: Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters.

Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)

Impact Factor: 6.626

Times cited: 61

DOI: 10.1039/b406468m

Additional Links: UA library record; WoS full record; WoS citing articles

show.php?record=1025