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| Author | Ye, M.; Schroeder, J.; Deltour, R.; Delplancke, M.P.; Winand, R.; Verbist, K.; Van Tendeloo, G. | ||||
| Title | Structural properties of c-axis oriented epitaxial YBa2Cu3O7-\delta thin films | Type | A1 Journal article | ||
Year  |
1997 | Publication | Superlattices and microstructures | Abbreviated Journal | Superlattice Microst |
| Volume | 21 | Issue | suppl.A | Pages | 287-290 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | A1997WM76700041 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0749-6036 | ISBN | Additional Links | UA library record; WoS full record; | |
| Impact Factor | 2.123 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 2.123; 1997 IF: 0.694 | |||
| Call Number | UA @ lucian @ c:irua:15470 | Serial | 3255 | ||
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