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| Author | Lamas, J.S.; Leroy, W.P.; Lu, Y.-G.; Verbeeck, J.; Van Tendeloo, G.; Depla, D. | ||||
| Title | Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films | Type | A1 Journal article | ||
Year  |
2014 | Publication | Surface and coatings technology | Abbreviated Journal | Surf Coat Tech |
| Volume | 238 | Issue | Pages | 45-50 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | In this work, Yttria-stabilized zirconia (YSZ) thin films were deposited using dual reactive magnetron sputtering. By varying the deposition conditions, the film morphology and texture of the thin films are tuned and biaxial alignment is obtained. Studying the crystallographic and microstructural properties of the YSZ thin films, a tilted columnar growth was identified. This tilt is shown to be dependent on the compositional gradient of the sample. The variation of composition within a single YSZ column measured via STEM-EDX is demonstrated to be equal to the macroscopic variation on a full YSZ sample when deposited under the same deposition parameters. A simple stress model was developed to predict the tilt of the growing columns. The results indicate that this model not only determines the column bending of the growing film but also confirms that a macroscopic approach is sufficient to determine the compositional gradient in a single column of the YSZ thin films. (C) 2013 Elsevier B.V. All rights reserved. | ||||
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| Publisher | Place of Publication | Lausanne | Editor | ||
| Language | Wos | 000331028200005 | Publication Date | 2013-10-29 | |
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| ISSN | 0257-8972; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.589 | Times cited | 8 | Open Access | |
| Notes | 246791 Countatoms; 278510 Vortex;Nmp3-La-2010-246102 Ifox; 312483 Esteem2; esteem2jra3 ECASJO; | Approved | Most recent IF: 2.589; 2014 IF: 1.998 | ||
| Call Number | UA @ lucian @ c:irua:115765 | Serial | 3827 | ||
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