NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L.	Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy	2012	Applied Physics Letters	112	14	UA library record; WoS full record; WoS citing articles
Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L.	Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy	2012	Applied Physics Letters	100		UA library record; WoS full record; WoS citing articles